TCAD Simulation of Data Retention Characteristics of Charge Trap Device for 3-D NAND Flash Memory

Author(s):  
Dongyean Oh ◽  
Bonghoon Lee ◽  
Eunmee Kwon ◽  
Sangyong Kim ◽  
Gyuseog Cho ◽  
...  
2007 ◽  
Vol 28 (8) ◽  
pp. 750-752 ◽  
Author(s):  
M. Park ◽  
Kangdeog Suh ◽  
Keonsoo Kim ◽  
S. Hur ◽  
K. Kim ◽  
...  

2003 ◽  
Vol 24 (12) ◽  
pp. 748-750 ◽  
Author(s):  
Jae-Duk Lee ◽  
Jeong-Hyuk Choi ◽  
Donggun Park ◽  
Kinam Kim

2017 ◽  
Vol 17 (5) ◽  
pp. 584-590
Author(s):  
Seunghyun Kim ◽  
Sang-Ho Lee ◽  
Sang-Ku Park ◽  
Youngmin Kim ◽  
Seongjae Cho ◽  
...  

2009 ◽  
Vol 30 (2) ◽  
pp. 155-157 ◽  
Author(s):  
M. Park ◽  
Eungjin Ahn ◽  
Eunsuk Cho ◽  
Keonsoo Kim ◽  
Won-Seong Lee

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