Investigation of reliability issue in tunneling and inter-poly dielectrics in floating gate NAND flash memory cell strings

2011 ◽  
Author(s):  
Jong-Ho Lee ◽  
Sung-Min Joe
Keyword(s):  
Flash Memory ◽  
Memory Cell ◽  
Floating Gate ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Flash Memory Cell ◽  
Reliability Issue

Effects of floating-gate interference on NAND flash memory cell operation

2002 ◽  
Vol 23 (5) ◽  
pp. 264-266 ◽  
Author(s):  
Jae-Duk Lee ◽  
Sung-Hoi Hur ◽  
Jung-Dal Choi
Keyword(s):  
Flash Memory ◽  
Memory Cell ◽  
Floating Gate ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Flash Memory Cell

Effect of Adjacent Bit-Line Cell Interference on Low Frequency Noise in NAND Flash Memory Cell Strings

2013 ◽  
Vol 13 (9) ◽  
pp. 6405-6408 ◽  
Author(s):  
Bong-Su Jo ◽  
Sung-Min Joe ◽  
Min-Kyu Jeong ◽  
Kyung-Rok Han ◽  
Sung-Kye Park ◽  
...  
Keyword(s):  
Flash Memory ◽  
Low Frequency ◽  
Memory Cell ◽  
Frequency Noise ◽  
Nand Flash ◽  
Low Frequency Noise ◽  
Nand Flash Memory ◽  
Flash Memory Cell

Diode-Type NAND Flash Memory Cell String Having Super-Steep Switching Slope Based on Positive Feedback

2016 ◽  
Vol 63 (4) ◽  
pp. 1533-1538 ◽  
Author(s):  
Sung-Min Joe ◽  
Ho-Jung Kang ◽  
Nagyong Choi ◽  
Myounggon Kang ◽  
Byung-Gook Park ◽  
...  
Keyword(s):  
Positive Feedback ◽  
Flash Memory ◽  
Memory Cell ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Flash Memory Cell
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