ESD protection design for wideband RF applications in 65-nm CMOS process

Author(s):  
Li-Wei Chu ◽  
Chun-Yu Lin ◽  
Ming-Dou Ker ◽  
Ming-Hsiang Song ◽  
Jen-Chou Tseng ◽  
...  
2002 ◽  
Vol 54 (1) ◽  
pp. 55-71 ◽  
Author(s):  
C Richier ◽  
P Salome ◽  
G Mabboux ◽  
I Zaza ◽  
A Juge ◽  
...  

2018 ◽  
Vol 65 (12) ◽  
pp. 5267-5274 ◽  
Author(s):  
Jie-Ting Chen ◽  
Chun-Yu Lin ◽  
Rong-Kun Chang ◽  
Ming-Dou Ker

Author(s):  
Yuan-Wen Hsiao ◽  
Ming-Dou Ker ◽  
Po-Yen Chiu ◽  
Chun Huang ◽  
Yuh-Kuang Tseng

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