Monolithic dual-wavelength lasers for CD-R/DVD±RW/R/RW

Author(s):  
S. Agatsuma ◽  
N. Hoshi ◽  
K. Tanno ◽  
H. Iki ◽  
S. Yoshida ◽  
...  
Keyword(s):  
2020 ◽  
Vol 111 ◽  
pp. 103519
Author(s):  
Shuangcheng Chen ◽  
Baole Lu ◽  
Zengrun Wen ◽  
Haowei Chen ◽  
Jintao Bai

2015 ◽  
Vol 55 (1) ◽  
pp. 104 ◽  
Author(s):  
Marius Mrohs ◽  
Lars Jensen ◽  
Stefan Günster ◽  
Thimotheus Alig ◽  
Detlev Ristau

2021 ◽  
Vol 13 (1) ◽  
Author(s):  
Youngbin Tchoe ◽  
Janghyun Jo ◽  
HoSung Kim ◽  
Heehun Kim ◽  
Hyeonjun Baek ◽  
...  

AbstractWe report monolithic integration of indium arsenide (InAs) nanorods and zinc oxide (ZnO) nanotubes using a multilayer graphene film as a suspended substrate, and the fabrication of dual-wavelength photodetectors with the hybrid configuration of these materials. For the hybrid nanostructures, ZnO nanotubes and InAs nanorods were grown vertically on the top and bottom surfaces of the graphene films by metal-organic vapor-phase epitaxy and molecular beam epitaxy, respectively. The structural, optical, and electrical characteristics of the hybrid nanostructures were investigated using transmission electron microscopy, spectral photoresponse analysis, and current–voltage measurements. Furthermore, the hybrid nanostructures were used to fabricate dual-wavelength photodetectors sensitive to both ultraviolet and mid-infrared wavelengths.


2021 ◽  
pp. 1-1
Author(s):  
Zhengru Guo ◽  
Tingting Liu ◽  
Junsong Peng ◽  
Yuanjun Zhu ◽  
Kun Huang ◽  
...  

2021 ◽  
pp. 1-1
Author(s):  
Olga Szewczyk ◽  
Piotr Pala ◽  
Karol Lech Tarnowski ◽  
Jacek Olszewski ◽  
Chuang Lu ◽  
...  

1993 ◽  
Vol 324 ◽  
Author(s):  
C. Pickering ◽  
D.A.O. Hope ◽  
W.Y. Leong ◽  
D.J. Robbins ◽  
R. Greef

AbstractIn-situ dual-wavelength ellipsometry and laser light scattering have been used to monitor growth of Si/Si1−x,Gex heterojunction bipolar transistor and multi-quantum well (MQW) structures. The growth rate of B-doped Si0 8Ge0.2 has been shown to be linear, but that of As-doped Si is non-linear, decreasing with time. Refractive index data have been obtained at the growth temperature for x = 0.15, 0.20, 0.25. Interface regions ∼ 6-20Å thickness have been detected at hetero-interfaces and during interrupted alloy growth. Period-to-period repeatability of MQW structures has been shown to be ±lML.


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