Experimental Study on Gyrotron Efficiency Enhancement

Author(s):  
E.M. Choi ◽  
A.J. Cerfon ◽  
M.A. Shapiro ◽  
J.R. Sirigiri ◽  
R.J. Temkin
Author(s):  
P. Samaraweera ◽  
J. M. D. S. Jeewandara ◽  
G.U.S. Gammampila ◽  
J. Keerthanan ◽  
J.V.U.P. Jayathunga ◽  
...  

2013 ◽  
Vol 589-590 ◽  
pp. 537-542 ◽  
Author(s):  
Dong Yuan ◽  
Long Sheng Lu

The external efficiency of LED is limited by total internal reflection on the interfacial surface. Surface structure modification is an effective way to solve this problem. In this work, micromachining method was present to manufacture surface microstructures for the GaN based LED light extraction efficiency enhancement. The feasibility of micromachining was discussed theoretically and proved by experimental study in this work. Micro-cutting and micro-forming approach was found be suitable for GaN surface microstructure machining. An experimental study of micro-cutting was carried out. The result shows that no crack and failure occurred during micro-cutting with 1μm cutting depth. This result demonstrated that microstructure can be machined on GaN based LED surface to enhance the LED light extraction efficiency.


Author(s):  
Norio Baba ◽  
Norihiko Ichise ◽  
Syunya Watanabe

The tilted beam illumination method is used to improve the resolution comparing with the axial illumination mode. Using this advantage, a restoration method of several tilted beam images covering the full azimuthal range was proposed by Saxton, and experimentally examined. To make this technique more reliable it seems that some practical problems still remain. In this report the restoration was attempted and the problems were considered. In our study, four problems were pointed out for the experiment of the restoration. (1) Accurate beam tilt adjustment to fit the incident beam to the coma-free axis for the symmetrical beam tilting over the full azimuthal range. (2) Accurate measurements of the optical parameters which are necessary to design the restoration filter. Even if the spherical aberration coefficient Cs is known with accuracy and the axial astigmatism is sufficiently compensated, at least the defocus value must be measured. (3) Accurate alignment of the tilt-azimuth series images.


Sign in / Sign up

Export Citation Format

Share Document