Metal/Insulator/Semiconductor contacts for ultimately scaled CMOS nodes: Projected benefits and remaining challenges
2017 ◽
Vol 38
(1)
◽
pp. 5-8
◽
1988 ◽
Vol 31
(10)
◽
pp. 1537-1539
◽
Keyword(s):
Keyword(s):
Keyword(s):