contact resistivities
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Materials ◽  
2021 ◽  
Vol 14 (22) ◽  
pp. 6774
Author(s):  
Julia Camut ◽  
Sahar Ayachi ◽  
Gustavo Castillo-Hernández ◽  
Sungjin Park ◽  
Byungki Ryu ◽  
...  

Thermoelectric generators are a reliable and environmentally friendly source of electrical energy. A crucial step for their development is the maximization of their efficiency. The efficiency of a TEG is inversely related to its electrical contact resistance, which it is therefore essential to minimize. In this paper, we investigate the contacting of an Al electrode on Mg2(Si,Sn) thermoelectric material and find that samples can show highly asymmetric electrical contact resistivities on both sides of a leg (e.g., 10 µΩ·cm2 and 200 µΩ·cm2). Differential contacting experiments allow one to identify the oxide layer on the Al foil as well as the dicing of the pellets into legs are identified as the main origins of this behavior. In order to avoid any oxidation of the foil, a thin layer of Zn is sputtered after etching the Al surface; this method proves itself effective in keeping the contact resistivities of both interfaces equally low (<10 µΩ·cm2) after dicing. A slight gradient is observed in the n-type leg’s Seebeck coefficient after the contacting with the Zn-coated electrode and the role of Zn in this change is confirmed by comparing the experimental results to hybrid-density functional calculations of Zn point defects.


2021 ◽  
Vol 12 ◽  
pp. 12
Author(s):  
Tobias Fellmeth ◽  
Frank Feldmann ◽  
Bernd Steinhauser ◽  
Henning Nagel ◽  
Sebastian Mack ◽  
...  

The aim of this work is to demonstrate the maturity of the TOPCon technology by conducting a round-robin on symmetrically processed lifetime samples in the leading European PV institutes EPFL, ISC, CEA-INES, ISFH, IMEC and Fraunhofer ISE within the H2020 funded project called HighLite. For all layers, dark saturation current-densities ranging between 2 and 10 fA/cm2 can be reported. Simultaneously, no metal induced recombination for the two lower sintering temperatures have been observed pointing towards a true passivated contact. Furthermore, contact resistivities below 10 mΩcm2 have been achieved. It seems that the industrial passivating contact matured to a fully passivated and conducting contact enabling full efficiency potential. The fact that this can be realized using either PECVD or LPCVD from various manufacturer is expected to drive costs down and contribute to the increased adoption of the TOPCon technology.


2018 ◽  
Author(s):  
M. Houssa ◽  
K. Iordanidou ◽  
A. Dabral ◽  
A. Lu ◽  
G. Pourtois ◽  
...  

2017 ◽  
Vol 64 (2) ◽  
pp. 500-506 ◽  
Author(s):  
Hao Yu ◽  
Marc Schaekers ◽  
Jian Zhang ◽  
Lin-Lin Wang ◽  
Jean-Luc Everaert ◽  
...  

2016 ◽  
Vol 31 (8) ◽  
pp. 08LT01 ◽  
Author(s):  
V S Senthil Srinivasan ◽  
Inga A Fischer ◽  
Lion Augel ◽  
Anja Hornung ◽  
Roman Koerner ◽  
...  

2016 ◽  
Vol 108 (17) ◽  
pp. 171602 ◽  
Author(s):  
Marc Schaekers ◽  
Kathy Barla ◽  
Naoto Horiguchi ◽  
Nadine Collaert ◽  
Aaron Voon-Yew Thean ◽  
...  

2013 ◽  
Vol 34 (6) ◽  
pp. 723-725 ◽  
Author(s):  
Zhen Zhang ◽  
Siyuranga Obasa Koswatta ◽  
Stephen W. Bedell ◽  
Ashish Baraskar ◽  
Michael Guillorn ◽  
...  

2011 ◽  
Vol 1298 ◽  
Author(s):  
Eliana Kamińska ◽  
Iwona Pasternak ◽  
Michał A. Borysiewicz ◽  
Marek Guziewicz ◽  
Anna Piotrowska ◽  
...  

ABSTRACTThe reported work focuses on developing antidiffusion barriers capable to increase the thermal stability of metal contacts above 700 C. In the chosen approach, such an antidiffusion barrier consists of several bilayers of materials with different crystalline structures. It has been demonstrated that an interface between such materials effectively blocks the atomic interdiffusion. In this work the following groups of materials were used as the bilayers: ZrB2 and ZrN and TaSiN and TiN. The materials were deposited by means of room temperature sputtering from elemental and compound targets in inert Ar and reactive Ar+N2 atmospheres. The structures were characterised using secondary ion mass spectroscopy depth profiling and scanning electron microscopy cross sectional imaging directly after deposition and after degradation. I-V characteristics were measured and contact resistivities were determined from the circular transmission line method.


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