scholarly journals A 0.39–3.56-μW Wide-Dynamic-Range Universal Multi-Sensor Interface Circuit

2020 ◽  
Vol 20 (20) ◽  
pp. 12262-12273
Author(s):  
Mohammad Mehdi Moayer ◽  
Jarno Salomaa ◽  
Kari A. I. Halonen
Keyword(s):  
Dynamic Range ◽  
Wide Dynamic Range ◽  
Sensor Interface ◽  
Interface Circuit

A 2nd Order Delta-Sigma ADC for Pressure Sensor Interface

2013 ◽  
Vol 475-476 ◽  
pp. 554-559
Author(s):  
Jong Do Lee ◽  
Jae Hyeon Shin ◽  
Young Min Park ◽  
Yong Sik Kwak ◽  
Gil Cho Ahn
Keyword(s):  
Pressure Sensor ◽  
Dynamic Range ◽  
Signal To Noise Ratio ◽  
Second Order ◽  
Cmos Process ◽  
Signal To Noise ◽  
Sensor Interface ◽  
Interface Circuit ◽  
Piezoresistive Pressure Sensor ◽  
Delta Sigma

A second order delta-sigma analog-to-digital converter (ADC) including a bandgap reference, a bias circuit for sensor, and a digital filter for the interface of piezoresistive pressure sensor is presented. The proposed sensor interface circuit is designed to target a pressure range from 0 to 100 psi. The prototype sensor interface circuit is implemented in a 0.35 μm CMOS process. The single-loop, 1-bit, second-order delta-sigma ADC operates at OSR of 256 achieves 80.5 dB dynamic range (DR), 79.6 dB peak signal-to-noise ratio (SNR), and 74.4 dB peak signal-to-noise and distortion ratio (SNDR) over a signal bandwidth of 7.8 kHz with 3.3V supply while consuming 0.33mW including on-chip reference and bias current for sensor. (in Performance Summary: 0.95mW)

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

Design of an Offner convex grating radiation calibration light source with a wide dynamic range

2020 ◽  
Vol 13 (5) ◽  
pp. 1085-1093
Author(s):  
XU Da ◽  
◽  
YUE Shi-xin ◽  
ZHANG Guo-yu ◽  
SUN Gao-fei ◽  
...  
Keyword(s):  
Light Source ◽  
Dynamic Range ◽  
Wide Dynamic Range
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