Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress
2015 ◽
Vol 36
(6)
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pp. 579-581
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2015 ◽
Vol 72
(3)
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pp. 30102
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2012 ◽
Vol 52
(9-10)
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pp. 2215-2219
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2016 ◽
Vol 4
(5)
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pp. 353-357
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2006 ◽
Vol 45
(No. 42)
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pp. L1127-L1129
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