Enhanced carrier confinement in AlInGaN-InGaN quantum wells in near ultraviolet light-emitting diodes

2006 ◽  
Vol 18 (11) ◽  
pp. 1276-1278 ◽  
Author(s):  
Sung-Ho Baek ◽  
Jeom-Oh Kim ◽  
Min-Ki Kwon ◽  
Il-Kyu Park ◽  
Seok-In Na ◽  
...  
2015 ◽  
Vol 66 (10) ◽  
pp. 1554-1558 ◽  
Author(s):  
Hyo-Shik Choi ◽  
Dong-Guang Zheng ◽  
Hyunsung Kim ◽  
Jong-In Shim ◽  
Dong-Soo Shin

2013 ◽  
Vol 34 (5) ◽  
pp. 623-628
Author(s):  
李梅娇 LI Mei-jiao ◽  
李凯 LI Kai ◽  
朱明军 ZHU Ming-jun ◽  
郭志友 GUO Zhi-you ◽  
孙慧卿 SUN Hui-qing

2003 ◽  
Vol 83 (24) ◽  
pp. 4906-4908 ◽  
Author(s):  
Satoshi Watanabe ◽  
Norihide Yamada ◽  
Masakazu Nagashima ◽  
Yusuke Ueki ◽  
Chiharu Sasaki ◽  
...  

2019 ◽  
Vol 9 (5) ◽  
pp. 871 ◽  
Author(s):  
Abu Islam ◽  
Dong-Soo Shim ◽  
Jong-In Shim

We investigate the differences in optoelectronic performances of InGaN/AlGaN multiple-quantum-well (MQW) near-ultraviolet light-emitting diodes by using samples with different indium compositions. Various macroscopic characterizations have been performed to show that the strain-induced piezoelectric field (FPZ), the crystal quality, and the internal quantum efficiency increase with the sample’s indium composition. This improved performance is owing to the carrier recombination at relatively defect-free indium-rich localized sites, caused by the local in-plane potential-energy fluctuation in MQWs. The potential-energy fluctuation in MQWs are considered to be originating from the combined effects of the inhomogeneous distribution of point defects, FPZ, and indium compositions.


2015 ◽  
Vol 23 (7) ◽  
pp. A337 ◽  
Author(s):  
Hung-Ming Chang ◽  
Wei-Chih Lai ◽  
Wei-Shou Chen ◽  
Shoou-Jinn Chang

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