Dynamic and low frequency noise characterization at cryogenic temperatures of Si-Ge heterojunction-bipolar transistors
2003 ◽
Vol 50
(4)
◽
pp. 921-927
◽
1998 ◽
Vol 46
(11)
◽
pp. 1604-1613
◽
2005 ◽
Vol 49
(8)
◽
pp. 1361-1369
◽
2000 ◽
Vol 40
(11)
◽
pp. 1897-1903
◽
1991 ◽
Vol 39
(6)
◽
pp. 1054-1058
◽
2007 ◽
1992 ◽
Vol 39
(10)
◽
pp. 2383-2394
◽