Dynamic and low frequency noise characterization at cryogenic temperatures of Si-Ge heterojunction-bipolar transistors

Author(s):  
C. Arnaboldi ◽  
G. Boella ◽  
G. Pessina
1995 ◽  
Vol 78 (4) ◽  
pp. 2565-2567 ◽  
Author(s):  
A. Ouacha ◽  
M. Willander ◽  
R. Plana ◽  
J. Graffeuil ◽  
L. Escotte ◽  
...  

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