Time Based Preventative Maintenance Policies for Circuit Breakers with Multiple Failure Types

Author(s):  
Will Wascom ◽  
Yisha Xiang
Spinal Cord ◽  
2021 ◽  
Author(s):  
Anand Mhatre ◽  
Jon Pearlman ◽  
Mark Schmeler ◽  
Benjamin Krider ◽  
John Fried

Abstract Study design Secondary data analysis of wheelchair failures and service repair logs from a network of wheelchair suppliers. Objective To determine the frequency of wheelchair caster failures and service repairs across wheelchair manufacturers and models and investigate the relationships between them. Setting Wheelchair caster failures and service repairs occurred in the community. Methods Reported caster failure types were classified based on the risk they pose for user injuries and wheelchair damage. Caster failures experienced by users of tilt-in-space and ultralightweight manual wheelchair models and Group 2, 3 and 4 power wheelchair models between January 2017 and October 2019 were analyzed using Chi-Square tests for independence. Correlational analysis of failures and service repairs was performed. Results A total of 6470 failures and 151 service repairs reported across four manufacturers and five models were analyzed. Failure types were significantly associated with manufacturers and models, respectively. Users of tilt-in-space wheelchairs, who require greater seating support, experienced twice the proportion of high-risk caster failures than the ultralightweight manual wheelchair users. Similarly, Group 3 and 4 power wheelchair users, who have complex rehabilitation needs, experienced 15-36% more high-risk failures than Group 2 users. Service repairs negatively correlated with high-risk manual wheelchair caster failures. Conclusions Wheelchair users who have greater seating and complex rehabilitation needs are at a higher risk for sustaining injuries and secondary health complications due to frequent caster failures. The study findings call for significant reforms in product quality and preventative maintenance practices that can reduce wheelchair failures and user consequences.


2013 ◽  
Vol 133 (10) ◽  
pp. 746-752 ◽  
Author(s):  
Chihaya Murakami ◽  
Aya Fujiwara ◽  
Shinichi Iwamoto

2020 ◽  
Vol 1 (1) ◽  
pp. 51-54
Author(s):  
Stanislav M. APOLLONSKY ◽  
◽  
Yury V. KUKLEV ◽  
Keyword(s):  

Author(s):  
DongKwon Jeong ◽  
JuHyeon Ahn ◽  
SangIn Lee ◽  
JooHyuk Chung ◽  
ByungLyul Park ◽  
...  

Abstract This paper presents the problems, the solutions, and the development state of the novel 0.18 μm Cu Metal Process through failure analysis of the Alpha CPU under development at Samsung Electronics. The presented problems include : “Via Bottom Lifting” induced by the Cu Via void, “Via Bottom dissociation” due to the IMD stress, “Via side dissociation” due to the poor formation of the Barrier Metal, “Via short/not-open failure” due to the IMD lifting, and Cu metal Corrosion/Loss. The analysis was carried out on the Via Contact Test Chain Patterns, using the “Electron (ION) Charge Up” method. After carefully analyzing each of the failure types, process improvement efforts followed. As a result, the pass rate of the via contact Rc was brought up from a mere 20% to 95%, and the device speed higher than 1.1 GHz was achieved, which surpasses the target speed of 1 GHz.


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