Channel length dependence of hot-carrier degradation of LATID-n-MOSFETs under analog operation
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1995 ◽
Vol 38
(1)
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pp. 183-187
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1991 ◽
Vol 15
(1-4)
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pp. 429-432
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1993 ◽
Vol 140
(6)
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pp. 431
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