Failure mechanism study for high resistance gate contact in dram devices for 2008 IRPS

2008 ◽  
Author(s):  
Eric Ng ◽  
Edmund Poh ◽  
David Lam ◽  
Zheng Xinhua
Keyword(s):  
Failure Mechanism ◽  
High Resistance ◽  
Mechanism Study

scholarly journals Failure Mechanism Study of Direct Action Solenoid Valve Based on Thermal-Structure Finite Element Model

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 58357-58368
Author(s):  
Jianfeng Li ◽  
Mingqing Xiao ◽  
Yao Sun ◽  
Guangshu Nie ◽  
Yaojun Chen ◽  
...  
Keyword(s):  
Finite Element ◽  
Finite Element Model ◽  
Failure Mechanism ◽  
Direct Action ◽  
Thermal Structure ◽  
Element Model ◽  
Solenoid Valve ◽  
Mechanism Study

Structure Failure Mechanism Study Based on Vulnerability Theory

2011 ◽  
Author(s):  
Zhiqiang Zhang ◽  
Guanxing Su ◽  
Jihong Ye ◽  
Xiaofeng "Bill" Zhang
Keyword(s):  
Failure Mechanism ◽  
Mechanism Study ◽  
Vulnerability Theory

Failure Mechanism Study of GaAs Technology.

1981 ◽  
Author(s):  
Lawrence S. Bowman ◽  
W. Tarn
Keyword(s):  
Failure Mechanism ◽  
Mechanism Study
Sign in / Sign up

Export Citation Format

Share Document