Polyimide sacrificial layer for an all-dry post-process surface micromachining module

Author(s):  
H.T.M. Pham ◽  
A. Bagolini ◽  
C.R. de Boer ◽  
J.M.W. Laros ◽  
L. Pakula ◽  
...  
1994 ◽  
Vol 356 ◽  
Author(s):  
S. Roy ◽  
S. Furukawa ◽  
H. Miyajima ◽  
M. Mehregany

AbstractThis paper reports in situ measurement of Young’s modulus and residual stress of electroless nickel films through the use of microfabricated nickel test structures, including electrostatic microactuators and passive devices. The test structures are fabricated in a new surface micromachining process, termed “nickel surface micromachining”, using electroless plated nickel as the structural layer and polysilicon as the sacrificial layer. Subsequent to fabrication, lateral resonant-type electrostatic microactuators of different geometries are resonated by electrical excitation. Using the measured resonant frequencies and knowledge of the device geometry, the Young’s modulus of the film is determined. The passive electroless nickel microstructures deform upon completion of the fabrication process due to residual stress in the film. Measurement of this deformation in conjunction with an appropriate mechanical model is used to determine the residual stress in the films.


2006 ◽  
Vol 45 ◽  
pp. 1293-1298 ◽  
Author(s):  
Vahid Fakhfouri ◽  
Sébastien Jiguet ◽  
Juergen Brugger

We describe a novel surface micromachining process for the fabrication of ceramic-type MEMS devices, such as free-standing cantilevers, that is based on the use of high-aspect ratio micromolds of SU8 and aluminum as sacrificial layer. 250μm-high and 100-1000μm-wide molds were used to confine a liquid precursor of SiC/Si3N4 based ceramics on the sacrificial layer that enables the detachment of the green body before the pyrolysis step at 1000°C. The final ceramic cantilever has dimensions ranging from 100-500μm x 1-2mm x 50μm and a smooth surface. Details of the processing, structural and material characterization such as Dynamic Rheological and Thermogravimetric Analysis under UV will be presented and compared to those found in the literature.


2018 ◽  
Vol 31 (3) ◽  
pp. 48-51
Author(s):  
Griselda Stephany Abarca-Jiménez ◽  
Gabriel Romero-Paredes Rubio ◽  
Mario Alfredo Reyes-Barranca ◽  
Miguel Ángel Alemán-Arce ◽  
Jacobo Esteban Munguía-Cervantes ◽  
...  

This work presents the results of different surface micromachining processes done on a chip from On Semiconductor 0.5 µm commercially available CMOS technology. The intended objective is to fabricate a MEMS inertial transducer in a monolithic substrate, as the electronics for signal processing are based on a Floating Gate MOS transistor, fully integrated in the electromechanical structure. According to the available layers and design rules from the foundry, an inertial sensor chip was designed and fabricated, except the last post–processing step, i.e., the removal of the sacrificial layer and thus releasing the inertial structure based on a surface micromachining process, allowing the completed device to behave as designed.


2002 ◽  
Vol 12 (4) ◽  
pp. 385-389 ◽  
Author(s):  
A Bagolini ◽  
L Pakula ◽  
T L M Scholtes ◽  
H T M Pham ◽  
P J French ◽  
...  

2017 ◽  
Vol 26 (2) ◽  
pp. 406-414 ◽  
Author(s):  
Michal Zawierta ◽  
Mariusz Martyniuk ◽  
Roger D. Jeffery ◽  
Gino Putrino ◽  
Adrian Keating ◽  
...  

Sadhana ◽  
2009 ◽  
Vol 34 (4) ◽  
pp. 557-562
Author(s):  
Vivekanand Bhatt ◽  
Sudhir Chandra ◽  
Chatar Singh

Author(s):  
Meetul Goyal ◽  
Robert C. Anderson ◽  
Jordan M. Berg ◽  
Richard O. Gale ◽  
Mark Holtz ◽  
...  

Many fabrication steps for micro electromechanical and micro optoelectromechanical systems (MEMS and MOEMS) are carried out on specialized or highly customized tools that are not part of a standard microelectronics process flow. This paper presents a surface micromachining process for electrostatically-actuated MEMS devices using standard microelectronics tools, materials, and process conditions. The result should facilitate MEMS development in university laboratories with a microelectronics focus, and encourage the transfer of MEMS production to aging or underutilized industrial facilities. Aluminum structures, with silicon dioxide or silicon nitride dielectric layers, are built upon a silicon or glass wafer substrate. Shipley SC1827 photoresist provides a 2.7 μm thick sacrificial layer. The release etch is the critical fabrication step. This must be a dry process to avoid stiction, should be isotropic to minimize the etch time, and should be capable of large undercut distances to minimize the need for etch holes. Finally, the etch must be sufficiently selective to allow for the necessary release etch time without significantly impacting non-sacrificial structures. An O2/CHF3 plasma etch has been developed to meet these requirements. Using this process we have designed, fabricated and tested structures with moveable mirrors suspended over multiple drive and sense electrodes.


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