Theory and use of in-line refractive index analyzers for improved process control

Voltage bias of several hundred volts which are applied between solar cells and module frames may lead to significant power losses, so-called potential-induced degradation (PID), in normal photovoltaic (PV) installations system. Modules and minimodules are used to conduct PID test of solar cells. The test procedure is time consuming and of high cost, which cannot be used as process monitoring method during solar cells fabrication. In this paper, three kinds of test including minimodule,Rsh, and V-Q test are conducted on solar cells or wafers with SiNxof different refractive index. All comparisons between test results ofRsh, V-Q, and minimodule tests have shown equal results. It is shown thatRshtest can be used as quality inspection of solar cells and V-Q test of coated wafer can be used as process control of solar cells.

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Refractive index determination as a tool for temperature measurement and process control: a new approach

10.1117/12.194335 ◽

1994 ◽

Cited By ~ 1

Author(s):

Johannes K. Schaller ◽

S. Wassenberg ◽

Detlev K. Fiedler ◽

Christo G. Stojanoff

Keyword(s):

Refractive Index ◽

Process Control ◽

Temperature Measurement ◽

New Approach

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Process Control by Refractive Index

Industrial & Engineering Chemistry ◽

10.1021/i650599a758 ◽

1959 ◽

Vol 51 (11) ◽

pp. 69A-70A

Author(s):

R. F. Wall

Keyword(s):

Refractive Index ◽

Process Control

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INSTRUMENTATION—Process Control by Refractive Index

Industrial & Engineering Chemistry ◽

10.1021/ie50599a010 ◽

1959 ◽

Vol 51 (11) ◽

pp. 69A-70A

Author(s):

R. F. Wall

Keyword(s):

Refractive Index ◽

Process Control

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TEM characterization of proton-exchanged LiNbO3 optical waveguides

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014395x ◽

1986 ◽

Vol 44 ◽

pp. 480-481

Author(s):

W. E. Lee

Keyword(s):

Refractive Index ◽

Benzoic Acid ◽

Optical Waveguides ◽

Total Internal Reflection ◽

Index Of Refraction ◽

Optical Measurements ◽

Lithium Ions ◽

Wide Channel ◽

Tem Characterization

An optical waveguide consists of a several-micron wide channel with a slightly different index of refraction than the host substrate; light can be trapped in the channel by total internal reflection.Optical waveguides can be formed from single-crystal LiNbO3 using the proton exhange technique. In this technique, polished specimens are masked with polycrystal1ine chromium in such a way as to leave 3-13 μm wide channels. These are held in benzoic acid at 249°C for 5 minutes allowing protons to exchange for lithium ions within the channels causing an increase in the refractive index of the channel and creating the waveguide. Unfortunately, optical measurements often reveal a loss in waveguiding ability up to several weeks after exchange.

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Light microscopy of ceramics

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010015037x ◽

1993 ◽

Vol 51 ◽

pp. 908-909

Author(s):

Walter C. McCrone

Keyword(s):

Refractive Index ◽

Light Microscopy ◽

Light Microscope ◽

Polarized Light ◽

Refractive Indices ◽

Complete Coverage ◽

The Subject ◽

Lower Refractive Index

An excellent chapter on this subject by V.D. Fréchette appeared in a book edited by L.L. Hench and R.W. Gould in 1971 (1). That chapter with the references cited there provides a very complete coverage of the subject. I will add a more complete coverage of an important polarized light microscope (PLM) technique developed more recently (2). Dispersion staining is based on refractive index and its variation with wavelength (dispersion of index). A particle of, say almandite, a garnet, has refractive indices of nF = 1.789 nm, nD = 1.780 nm and nC = 1.775 nm. A Cargille refractive index liquid having nD = 1.780 nm will have nF = 1.810 and nC = 1.768 nm. Almandite grains will disappear in that liquid when observed with a beam of 589 nm light (D-line), but it will have a lower refractive index than that liquid with 486 nm light (F-line), and a higher index than that liquid with 656 nm light (C-line).

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