A tool development of rigorous Schr�ger/Luttinger based Monte Carlo codes for scaled MOS studies in terms of crystal orientation, channel direction, mechanical stress and applied voltage
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2009 ◽
Vol 156
(2)
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pp. E29
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1974 ◽
Vol 22
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pp. 307
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1988 ◽
Vol 102
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pp. 79-81
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1983 ◽
Vol 41
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pp. 518-519
1972 ◽
Vol 30
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pp. 550-551