Application of charge pumping technique for investigation of interface-trap behaviour during thermal annealing of irradiated power VDMOSFETs
1991 ◽
Vol 38
(8)
◽
pp. 1820-1831
◽
2001 ◽
Vol 45
(10)
◽
pp. 1717-1723
◽
1996 ◽
Vol 43
(4)
◽
pp. 605-612
◽
Keyword(s):
Keyword(s):
Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs
2012 ◽
Vol 59
(6)
◽
pp. 3062-3068
◽
Keyword(s):
Keyword(s):