High temperature DC characterization of fully-depleted 0.5 /spl mu/m SOS-CMOS MOSFETs for analog circuit design

2003 ◽  
Author(s):  
Ericson ◽  
Britton ◽  
Rochelle ◽  
Blalock ◽  
Williamson ◽  
...  
Keyword(s):  
High Temperature ◽  
Circuit Design ◽  
Analog Circuit ◽  
Analog Circuit Design ◽  
Fully Depleted ◽  
Dc Characterization

scholarly journals Review on double-gate MOSFETs and FinFETs modeling

2013 ◽  
Vol 26 (3) ◽  
pp. 197-213 ◽  
Author(s):  
A. Cerdeira ◽  
M. Estrada ◽  
J. Alvarado ◽  
I. Garduño ◽  
E. Contreras ◽  
...  
Keyword(s):  
Circuit Design ◽  
Analog Circuit ◽  
Research Field ◽  
Double Gate ◽  
Analog Circuit Design ◽  
Important Research ◽  
Compact Models

The development of compact models for double-gate (DG) MOSFETs and FinFETs necessary in circuit simulators is an important research field, which allows the efficient practical characterization of these devices, as well as their application in analog circuit design. In this paper we review and assess different approaches for developing core and complete compact models for DG MOSFETs and FinFETs.

Research of Low Noise Analog Measurement on High Temperature Thermocouple Based on dsPIC33

2013 ◽  
Vol 816-817 ◽  
pp. 938-942
Author(s):  
Qi Feng Lin ◽  
Shu Yong Mou
Keyword(s):  
High Temperature ◽  
Low Temperature ◽  
Circuit Design ◽  
Wide Temperature Range ◽  
Analog Circuit ◽  
Low Noise ◽  
Analog Circuit Design ◽  
Measurement Instruments ◽  
Thermocouple Measurement ◽  
Temperature Resolution

Since thermocouple has an intrinsic disadvantage that its signal is very weak, many problems usually appear such as large noise and low temperature resolution when thermocouples are being used. Aiming this defect on thermocouple measurement, this paper proposes a solution of analog circuit design that provides the character of low noise and high SNR. This paper discusses the analog circuit design and calculation based on the S-type thermocouple which is often used for a very wide temperature range. This designed module can be applied to measurement instruments.

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