A Compact Model for Valence-Band Electron Tunneling Current in Partially Depleted SOI MOSFETs
2007 ◽
Vol 54
(2)
◽
pp. 316-322
◽
Keyword(s):
Excess Low-Frequency Noise in Ultrathin Oxide n-MOSFETs Arising From Valence-Band Electron Tunneling
2005 ◽
Vol 52
(9)
◽
pp. 2061-2066
◽
Keyword(s):
1987 ◽
Vol 30
(1-4)
◽
pp. 298-303
◽
Keyword(s):
1999 ◽
Vol 48
(1-4)
◽
pp. 295-298
◽
Keyword(s):
Keyword(s):
2008 ◽
Vol 77
(10)
◽
pp. 103301
◽
Keyword(s):