Investigation of Electromigration Degradation Mechanism in Ti/Pt/Au Ohmic Contacts to p-GaAs Under High Current Density Stress
2017 ◽
Vol 64
(11)
◽
pp. 4581-4586
◽
Keyword(s):
2011 ◽
Vol 36
(14)
◽
pp. 8461-8467
◽
Keyword(s):
2010 ◽
Vol 50
(12)
◽
pp. 1967-1972
◽
Keyword(s):
Keyword(s):