Insight into Buffer Trap-Induced Current Saturation and Current Collapse in GaN RF Heterojunction Field-Effect Transistors
2020 ◽
Vol 67
(12)
◽
pp. 5460-5465
2008 ◽
Vol 600-603
◽
pp. 1329-1332
Keyword(s):
2013 ◽
Vol 1
(13)
◽
pp. 2433
◽
1984 ◽
Vol 31
(8)
◽
pp. 1015-1027
◽