Time-Dependent Hot Carrier Degradation in Polysilicon Emitter Bipolar Transistors Under High Current and Radiation Combined Stress

2021 ◽  
pp. 1-6
Author(s):  
Peijian Zhang ◽  
Zicheng Xu ◽  
Tao Wang ◽  
Wensuo Chen ◽  
Min Hong ◽  
...  
Keyword(s):  
Bipolar Transistors ◽  
Time Dependent ◽  
High Current ◽  
Combined Stress ◽  
Hot Carrier ◽  
Polysilicon Emitter ◽  
Hot Carrier Degradation

scholarly journals Hot-carrier stressing of NPN polysilicon emitter bipolar transistors incorporating fluorine

2003 ◽  
Vol 50 (4) ◽  
pp. 1141-1144 ◽  
Author(s):  
S.R. Sheng ◽  
W.R. McKinnon ◽  
S.P. McAlister ◽  
C. Storey ◽  
J.S. Hamel ◽  
...  
Keyword(s):  
Bipolar Transistors ◽  
Hot Carrier ◽  
Polysilicon Emitter

Hot-carrier induced degradation and recovery in polysilicon-emitter bipolar transistors

2002 ◽  
Vol 46 (10) ◽  
pp. 1603-1608 ◽  
Author(s):  
S.R Sheng ◽  
S.P McAlister ◽  
C Storey ◽  
L.-S Lee ◽  
H.P Hwang
Keyword(s):  
Bipolar Transistors ◽  
Hot Carrier ◽  
Polysilicon Emitter

Hot carrier degradation and time-dependent dielectric breakdown in oxides

1999 ◽  
Vol 49 (1-2) ◽  
pp. 27-40 ◽  
Author(s):  
G. Groeseneken ◽  
R. Degraeve ◽  
T. Nigam ◽  
G. Van den bosch ◽  
H.E. Maes
Keyword(s):  
Dielectric Breakdown ◽  
Time Dependent ◽  
Hot Carrier ◽  
Time Dependent Dielectric Breakdown ◽  
Hot Carrier Degradation

Temperature Dependent Reliability of Polysilicon Emitter Bipolar Transistors Under High Current Stress

2020 ◽  
Vol 20 (3) ◽  
pp. 548-554
Author(s):  
Kunfeng Zhu ◽  
Peijian Zhang ◽  
Wensuo Chen ◽  
Xueliang Xu ◽  
Kaizhou Tan ◽  
...  
Keyword(s):  
Bipolar Transistors ◽  
High Current ◽  
Temperature Dependent ◽  
Current Stress ◽  
Polysilicon Emitter
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