WTPGA: a novel weighted test-pattern generation approach for VLSI built-in self test
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International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering
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2014 ◽
Vol 03
(08)
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pp. 11487-11495
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2011 ◽
Vol 98
(3)
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pp. 301-309
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2017 ◽
Vol 25
(3)
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pp. 942-953
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1991 ◽
Vol 138
(2)
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pp. 179
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