Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

ABSTRACTWe have mapped the full crystallographic orientation of sea ice using electron backscatter diffraction (EBSD). This is the first time EBSD has been used to study sea ice. Platelet ice is a feature of sea ice near ice shelves. Ice crystals accumulate as an unconsolidated sub-ice platelet layer beneath the columnar ice (CI), where they are subsumed by the advancing sea–ice interface to form incorporated platelet ice (PI). As is well known, in CI the crystal preferred orientation comprises dominantly horizontal c-axes, while PI has c-axes varying between horizontal and vertical. For the first time, this study shows the a-axes of CI and PI are not random. Misorientation analysis has been used to illuminate the possible drivers of these alignments. In CI the misorientation angle distribution from random pairs and neighbour pairs of grains are indistinguishable, indicating the distributions are a consequence of crystal preferred orientation. Geometric selection during growth will develop the a-axis alignment in CI if ice growth in water is fastest parallel to the a-axis, as has previously been hypothesised. In contrast, in PI random-pair and neighbour-pair misorientation distributions are significantly different, suggesting mechanical rotation of crystals at grain boundaries as the most likely explanation.

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Twin and topotactic growth of β-eucryptite dendrites and their lattice coincidence analysed by the reticular theory

Journal of Applied Crystallography ◽

10.1107/s0021889812047553 ◽

2013 ◽

Vol 46 (1) ◽

pp. 216-223

Author(s):

Shan-Rong Zhao ◽

Hai-Jun Xu ◽

Rong Liu ◽

Qin-Yan Wang ◽

Xian-Yu Liu

Keyword(s):

Solid Solution ◽

Crystallographic Orientation ◽

Electron Backscatter Diffraction ◽

Electron Backscatter ◽

Ebsd Technique ◽

Backscatter Diffraction ◽

Orientation Determination

Snowflake-shaped dendrites of β-eucryptite–β-quartz solid solution were artificially crystallized in a matt glaze, and the crystallographic orientation of the dendrites was analysed by the electron backscatter diffraction (EBSD) technique. The six branches of a snowflake-shaped dendrite in the plane (0001) are along 〈110〉. From the orientation determination, a twin relationship and a topotactic relationship between dendrites were found. The twin axes are [011], [0{\overline 1}1] and [210], and the twin planes perpendicular to the twin axes are ({\overline 1}2{\overline 1}2) and (1{\overline 2}12). From the reticular theory of twinning, it was calculated that the twin indexn= 2 and the obliquity ω = 3.2877°. The studied dendrite is a twin by reticular pseudomerohedry with low twin index and obliquity. In the topotactic growth, no twin elements have been found, but the three main crystallographic directions 〈001〉, 〈210〉 and 〈110〉 of the two dendritic crystals overlap each other. The degree of lattice coincidence between the two crystals in this topotactic growth is also discussed.

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Assessing the influence of crystallographic orientation, stress and local deformation on magnetic domains using electron backscatter diffraction and forescatter electron imaging

Ultramicroscopy ◽

10.1016/j.ultramic.2018.12.012 ◽

2019 ◽

Vol 198 ◽

pp. 33-42 ◽

Cited By ~ 3

Author(s):

T. Ickler ◽

H. Meckbach ◽

F. Zeismann ◽

A. Brückner-Foit

Keyword(s):

Crystallographic Orientation ◽

Electron Backscatter Diffraction ◽

Local Deformation ◽

Magnetic Domains ◽

Electron Backscatter ◽

Electron Imaging ◽

Backscatter Diffraction

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Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy

Applied Physics Express ◽

10.7567/1882-0786/aafb26 ◽

2019 ◽

Vol 12 (2) ◽

pp. 025501 ◽

Cited By ~ 1

Author(s):

Mel Hainey ◽

Yoann Robin ◽

Hiroshi Amano ◽

Noritaka Usami

Keyword(s):

Thin Films ◽

Pole Figure ◽

Electron Backscatter Diffraction ◽

Silicon Thin Films ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

Seed Layers

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Misorientations in [0 0 1] Magnetite Thin Films Studied by Electron Backscatter Diffraction

Microscopy and Microanalysis ◽

10.1017/s1431927607081810 ◽

2007 ◽

Vol 13 (S03) ◽

Author(s):

A Koblischka-Veneva ◽

M R Koblischka ◽

F Mücklich ◽

U Hartmann ◽

S Murphy ◽

...

Keyword(s):

Thin Films ◽

Electron Backscatter Diffraction ◽

Electron Backscatter ◽

Backscatter Diffraction

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Crystallographic orientation of ilmenite inclusions in amphibole – an electron backscatter diffraction study

Zeitschrift für Kristallographie - Crystalline Materials ◽

10.1515/zkri-2020-0003 ◽

2020 ◽

Vol 235 (4-5) ◽

pp. 105-116

Author(s):

Chang Xu ◽

Shanrong Zhao ◽

Jiaohua Zhou ◽

Xu He ◽

Haijun Xu

Keyword(s):

Crystallographic Orientation ◽

Electron Backscatter Diffraction ◽

Reduction Reaction ◽

Formation Temperature ◽

Orientation Relationships ◽

Ultra High Pressure ◽

Electron Backscatter ◽

Metamorphic Terrane ◽

Backscatter Diffraction ◽

Group 1

AbstractOrientated ilmenite inclusions have been discovered in amphibole of hornblendite from the Zhujiapu area, Dabie ultra-high-pressure (UHP) metamorphic terrane, China. In order to characterize the crystallographic orientation relationships between ilmenite inclusions and amphibole host and reconstruct the mechanism of their formation, we present an electron backscatter diffraction (EBSD) analysis combined with energy dispersive spectroscopy (EDS) analysis and electron microprobe analysis (EPMA) for ilmenite inclusions and amphibole host. The inclusions can be subdivided into four groups: (1) 60.2% of ilmenites have the crystallographic orientation {0001}Ilm // {100}Amp, (101̅0)Ilm // {010}Amp, [112̅0]Ilm // <001> Amp and [112̅0]Ilm // <012 > Amp. (2) 16.5% of ilmenites have <0001> Ilm // <001> Amp, (101̅0)Ilm // {010}Amp, (112̅0)Ilm // {100}Amp and [3̅031]Ilm // <012> Amp. (3) 13.8% of ilmenites have <0001> Ilm // <012> Amp, (112̅0)Ilm // {100}Amp and [3̅031]Ilm // <001> Amp. (4) 9.5% of ilmenites have <0001> Ilm // [1̅12]Amp, (101̅0)Ilm // {201}Amp, [112̅0]Ilm // [1̅12]Amp and ${[11\overline {21} ]_{Ilm}}$// <010> Amp. By comparing the lattice relationship between ilmenite inclusions and amphibole hosts, it is shown that the frequency of the ilmenite inclusions in different groups is related to the lattice coherency and oxygen packing. Group-1 of the ilmenite inclusions was most likely be formed via a solid-state exsolution process by cooling of the hornblendite after the intrusion was emplaced. The other three groups of ilmenite inclusions were probably formed via reduction reaction in an open system. The formation temperature of the ilmenite inclusions is estimated by using the TiO2 solubility geothermeter in amphibole. The minimum formation temperature of the ilmenite inclusions is about 1025 °C, and the maximum formation temperature of the ilmenite inclusions is about 1126 °C.

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