Twin and topotactic growth of β-eucryptite dendrites and their lattice coincidence analysed by the reticular theory

2013 ◽  
Vol 46 (1) ◽  
pp. 216-223
Author(s):  
Shan-Rong Zhao ◽  
Hai-Jun Xu ◽  
Rong Liu ◽  
Qin-Yan Wang ◽  
Xian-Yu Liu
Keyword(s):  
Solid Solution ◽  
Crystallographic Orientation ◽  
Electron Backscatter Diffraction ◽  
Electron Backscatter ◽  
Ebsd Technique ◽  
Backscatter Diffraction ◽  
Orientation Determination

Snowflake-shaped dendrites of β-eucryptite–β-quartz solid solution were artificially crystallized in a matt glaze, and the crystallographic orientation of the dendrites was analysed by the electron backscatter diffraction (EBSD) technique. The six branches of a snowflake-shaped dendrite in the plane (0001) are along 〈110〉. From the orientation determination, a twin relationship and a topotactic relationship between dendrites were found. The twin axes are [011], [0{\overline 1}1] and [210], and the twin planes perpendicular to the twin axes are ({\overline 1}2{\overline 1}2) and (1{\overline 2}12). From the reticular theory of twinning, it was calculated that the twin indexn= 2 and the obliquity ω = 3.2877°. The studied dendrite is a twin by reticular pseudomerohedry with low twin index and obliquity. In the topotactic growth, no twin elements have been found, but the three main crystallographic directions 〈001〉, 〈210〉 and 〈110〉 of the two dendritic crystals overlap each other. The degree of lattice coincidence between the two crystals in this topotactic growth is also discussed.

scholarly journals On the Use of EBSD and Microhardness to Study the Microstructure Properties of Tungsten Samples Prepared by Selective Laser Melting

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1215
Author(s):  
Mirza Atif Abbas ◽  
Yan Anru ◽  
Zhi Yong Wang
Keyword(s):  
Selective Laser Melting ◽  
Electron Backscatter Diffraction ◽  
Fusion Reactors ◽  
Laser Melting ◽  
Kikuchi Pattern ◽  
Plasma Facing Components ◽  
Electron Backscatter ◽  
Ebsd Technique ◽  
Temperature Exposure ◽  
Backscatter Diffraction

Additively manufactured tungsten and its alloys have been widely used for plasma facing components (PFCs) in future nuclear fusion reactors. Under the fusion process, PFCs experience a high-temperature exposure, which will ultimately affect the microstructural features, keeping in mind the importance of microstructures. In this study, microhardness and electron backscatter diffraction (EBSD) techniques were used to study the specimens. Vickers hardness method was used to study tungsten under different parameters. EBSD technique was used to study the microstructure and Kikuchi pattern of samples under different orientations. We mainly focused on selective laser melting (SLM) parameters and the effects of these parameters on the results of different techniques used to study the behavior of samples.

Texture and Microstructure Evolution in Friction Stir Welded Cu-Al Sheets Characterized by EBSD

2011 ◽  
Vol 702-703 ◽  
pp. 574-577 ◽  
Author(s):  
Daniel Goran ◽  
G. Ji ◽  
M. N. Avettand-Fènoël ◽  
R. Taillard
Keyword(s):  
Microstructure Evolution ◽  
Electron Backscatter Diffraction ◽  
Texture Evolution ◽  
Weld Interface ◽  
Friction Stir ◽  
Electron Backscatter ◽  
Ebsd Technique ◽  
Backscatter Diffraction

Texture and microstructure of FSW joined Al and Cu sheets were investigated by means of electron backscatter diffraction (EBSD) technique. The analysis has revealed a strong texture evolution on both sides of the weld interface as well as a very complex microstructure. Grains were found to be fully recrystallized on both sides of the weld and with different average diameters at different specific zones of the weld.

scholarly journals Using electron backscatter diffraction to measure full crystallographic orientation in Antarctic land-fast sea ice

2018 ◽  
Vol 64 (247) ◽  
pp. 771-780 ◽  
Author(s):  
PAT WONGPAN ◽  
DAVID J. PRIOR ◽  
PATRICIA J. LANGHORNE ◽  
KATHERINE LILLY ◽  
INGA J. SMITH
Keyword(s):  
Sea Ice ◽  
Crystallographic Orientation ◽  
Electron Backscatter Diffraction ◽  
Preferred Orientation ◽  
Angle Distribution ◽  
Crystal Preferred Orientation ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
First Time ◽  
Platelet Ice

ABSTRACTWe have mapped the full crystallographic orientation of sea ice using electron backscatter diffraction (EBSD). This is the first time EBSD has been used to study sea ice. Platelet ice is a feature of sea ice near ice shelves. Ice crystals accumulate as an unconsolidated sub-ice platelet layer beneath the columnar ice (CI), where they are subsumed by the advancing sea–ice interface to form incorporated platelet ice (PI). As is well known, in CI the crystal preferred orientation comprises dominantly horizontal c-axes, while PI has c-axes varying between horizontal and vertical. For the first time, this study shows the a-axes of CI and PI are not random. Misorientation analysis has been used to illuminate the possible drivers of these alignments. In CI the misorientation angle distribution from random pairs and neighbour pairs of grains are indistinguishable, indicating the distributions are a consequence of crystal preferred orientation. Geometric selection during growth will develop the a-axis alignment in CI if ice growth in water is fastest parallel to the a-axis, as has previously been hypothesised. In contrast, in PI random-pair and neighbour-pair misorientation distributions are significantly different, suggesting mechanical rotation of crystals at grain boundaries as the most likely explanation.

scholarly journals Application of Electron Backscatter Diffraction (EBSD) for Crystallographic Characterization of Aluminum-Doped Zinc Oxide Sputtered Films

2013 ◽  
Vol 19 (S4) ◽  
pp. 103-104
Author(s):  
C.B. Garcia ◽  
E. Ariza ◽  
C.J. Tavares
Keyword(s):  
Electron Microscopy ◽  
Grain Size ◽  
Zinc Oxide ◽  
Electron Backscatter Diffraction ◽  
Wide Range ◽  
Electron Backscatter ◽  
Aluminum Doped Zinc Oxide ◽  
Ebsd Technique ◽  
Backscatter Diffraction

Zinc Oxide is a wide band-gap compound semiconductor that has been used in optoelectronic and photovoltaic applications due to its good electrical and optical properties. Aluminium has been an efficient n-type dopant for ZnO to produce low resistivity films and high transparency to visible light. In addition, the improvement of these properties also depends on the morphology, crystalline structure and deposition parameters. In this work, ZnO:Al films were produced by d.c. pulsed magnetron sputtering deposition from a ZnO ceramic target (2.0 wt% Al2O3) on glass substrates, at a temperature of 250 ºC.The crystallographic orientation of aluminum doped zinc oxide (ZnO:Al) thin films has been studied by Electron Backscatter Diffraction (EBSD) technique. EBSD coupled with Scanning Electron Microscopy (SEM) is a powerful tool for the microstructural and crystallographic characterization of a wide range of materials.The investigation by EBSD technique of such films presents some challenges since this analysis requires a flat and smooth surface. This is a necessary condition to avoid any shadow effects during the experiments performed with high tilting conditions (70º). This is also essential to ensure a good control of the three dimensional projection of the crystalline axes on the geometrical references related to the sample.Crystalline texture is described by the inverse pole figure (IPF) maps (Figure 1). Through EBSD analysis it was observed that the external surface of the film presents a strong texture on the basal plane orientation (grains highlighted in red colour). Furthermore it was possible to verify that the grain size strongly depends on the deposition time (Figure 1 (a) and (b)). The electrical and optical film properties improve with increasing of the grain size, which can be mainly, attributed to the decrease in scattering grain boundaries which leads to an increasing in carrier mobility (Figure 2).The authors kindly acknowledge the financial support from the Portuguese Foundation for Science and Technology (FCT) scientific program for the National Network of Electron Microscopy (RNME) EDE/1511/RME/2005.

All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg

1997 ◽  
Vol 3 (S2) ◽  
pp. 387-388 ◽  
Author(s):  
J. R. Michael
Keyword(s):  
Electron Backscatter Diffraction ◽  
Photographic Film ◽  
Phase Identification ◽  
Electron Backscattered Diffraction ◽  
Bulk Specimen ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Over 40 Years ◽  
Orientation Determination ◽  
Scanning Electron

This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

Crystallographic correlation between 5M and 7M martensite in an Ni–Mn–Ga alloy

2016 ◽  
Vol 49 (2) ◽  
pp. 507-512
Author(s):  
Zongbin Li ◽  
Zhenzhuang Li ◽  
Bo Yang ◽  
Yudong Zhang ◽  
Claude Esling ◽  
...  
Keyword(s):  
Lattice Distortion ◽  
Electron Backscatter Diffraction ◽  
Deep Insight ◽  
Ferromagnetic Shape Memory Alloys ◽  
Electron Backscatter ◽  
Ferromagnetic Shape Memory ◽  
Backscatter Diffraction ◽  
Orientation Determination ◽  
Specific Orientation ◽  
Insight Into

In Ni–Mn–Ga ferromagnetic shape memory alloys, a structural transformation from one type of martensite to another is frequently observed upon cooling or heating. In this work, the microstructural features associated with the transformation from 5M to 7M martensite in an Ni50Mn26Ga22Cu2 alloy were studied. On the basis of the crystallographic orientation determination and an examination of the microstructure by means of the electron backscatter diffraction technique, the 5M to 7M transformation was found to be accompanied by the thickening of martensite plates. The two kinds of martensite (5M and 7M) possess a specific orientation relationship with (001)5M//(001)7M and [100]5M//[100]7M. Through further lattice distortion, four types of 5M variant can evolve into four 7M martensite variants in one variant colony. The present study is expected to provide a deep insight into the crystallographic correlation between 5M and 7M martensite in Ni–Mn–Ga alloys.

Crystallographic orientation of ilmenite inclusions in amphibole – an electron backscatter diffraction study

2020 ◽  
Vol 235 (4-5) ◽  
pp. 105-116
Author(s):  
Chang Xu ◽  
Shanrong Zhao ◽  
Jiaohua Zhou ◽  
Xu He ◽  
Haijun Xu
Keyword(s):  
Crystallographic Orientation ◽  
Electron Backscatter Diffraction ◽  
Reduction Reaction ◽  
Formation Temperature ◽  
Orientation Relationships ◽  
Ultra High Pressure ◽  
Electron Backscatter ◽  
Metamorphic Terrane ◽  
Backscatter Diffraction ◽  
Group 1

AbstractOrientated ilmenite inclusions have been discovered in amphibole of hornblendite from the Zhujiapu area, Dabie ultra-high-pressure (UHP) metamorphic terrane, China. In order to characterize the crystallographic orientation relationships between ilmenite inclusions and amphibole host and reconstruct the mechanism of their formation, we present an electron backscatter diffraction (EBSD) analysis combined with energy dispersive spectroscopy (EDS) analysis and electron microprobe analysis (EPMA) for ilmenite inclusions and amphibole host. The inclusions can be subdivided into four groups: (1) 60.2% of ilmenites have the crystallographic orientation {0001}Ilm // {100}Amp, (101̅0)Ilm // {010}Amp, [112̅0]Ilm // <001> Amp and [112̅0]Ilm // <012 > Amp. (2) 16.5% of ilmenites have <0001> Ilm // <001> Amp, (101̅0)Ilm // {010}Amp, (112̅0)Ilm // {100}Amp and [3̅031]Ilm // <012> Amp. (3) 13.8% of ilmenites have <0001> Ilm // <012> Amp, (112̅0)Ilm // {100}Amp and [3̅031]Ilm // <001> Amp. (4) 9.5% of ilmenites have <0001> Ilm // [1̅12]Amp, (101̅0)Ilm // {201}Amp, [112̅0]Ilm // [1̅12]Amp and ${[11\overline {21} ]_{Ilm}}$// <010> Amp. By comparing the lattice relationship between ilmenite inclusions and amphibole hosts, it is shown that the frequency of the ilmenite inclusions in different groups is related to the lattice coherency and oxygen packing. Group-1 of the ilmenite inclusions was most likely be formed via a solid-state exsolution process by cooling of the hornblendite after the intrusion was emplaced. The other three groups of ilmenite inclusions were probably formed via reduction reaction in an open system. The formation temperature of the ilmenite inclusions is estimated by using the TiO2 solubility geothermeter in amphibole. The minimum formation temperature of the ilmenite inclusions is about 1025 °C, and the maximum formation temperature of the ilmenite inclusions is about 1126 °C.

A Review of Strain Analysis Using Electron Backscatter Diffraction

2011 ◽  
Vol 17 (3) ◽  
pp. 316-329 ◽  
Author(s):  
Stuart I. Wright ◽  
Matthew M. Nowell ◽  
David P. Field
Keyword(s):  
Plastic Strain ◽  
Materials Science ◽  
Electron Backscatter Diffraction ◽  
Strain Analysis ◽  
Current State ◽  
Mapping Parameters ◽  
Submicron Scale ◽  
Electron Backscatter ◽  
Ebsd Technique ◽  
Backscatter Diffraction

AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.

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