Dose Rate and Extended Total Dose Characterization of Radiation Hardened Metal Gate CMOS Integrated Circuits

1978 ◽  
Vol 25 (6) ◽  
pp. 1172-1175 ◽  
Author(s):  
A. London ◽  
R. C. Wang
Keyword(s):  
Integrated Circuits ◽  
Total Dose ◽  
Dose Rate ◽  
Cmos Integrated Circuits ◽  
Metal Gate ◽  
Radiation Hardened

Total Dose and Dose Rate Radiation Characterization of EPI-CMOS Radiation Hardened Memory and Microprocessor Devices

1984 ◽  
Vol 31 (6) ◽  
pp. 1332-1336 ◽  
Author(s):  
B. L. Gingerich ◽  
J. M. Hermsen ◽  
J. C. Lee ◽  
J. E. Schroeder
Keyword(s):  
Total Dose ◽  
Dose Rate ◽  
Radiation Hardened

Total Dose and Dose Rate Radiation Characterization of a Hardened EPI-CMOS Gate Array

1984 ◽  
Vol 31 (6) ◽  
pp. 1327-1331 ◽  
Author(s):  
J. E. Schroeder ◽  
B. L. Gingerich ◽  
G. R. Bechtel
Keyword(s):  
Total Dose ◽  
Dose Rate ◽  
Gate Array

Total-dose characterization of a high-performance radiation-hardened 1.0- mu m CMOS sea-of-gates technology

1990 ◽  
Vol 37 (6) ◽  
pp. 2089-2096 ◽  
Author(s):  
I. Yoshii ◽  
K. Hama ◽  
K. Maeguchi ◽  
S. Takatsuka ◽  
H. Hatano
Keyword(s):  
Total Dose ◽  
High Performance ◽  
Radiation Hardened

An SEM based system for a complete characterization of latch-up in CMOS integrated circuits

Scanning ◽  
1986 ◽  
Vol 8 (1) ◽  
pp. 20-33 ◽  
Author(s):  
C. Canali ◽  
F. Fantini ◽  
M. Giannini ◽  
A. Senin ◽  
M. Vanzi ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Complete Characterization ◽  
Cmos Integrated Circuits ◽  
Latch Up

Total dose effects on bipolar integrated circuits: characterization of the saturation region

2004 ◽  
Vol 51 (6) ◽  
pp. 3225-3230 ◽  
Author(s):  
J. Boch ◽  
F. Saigne ◽  
S. Ducret ◽  
R.D. Schrimpf ◽  
D.M. Fleetwood ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Total Dose ◽  
Saturation Region ◽  
Dose Effects ◽  
Total Dose Effects
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