Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes
2020 ◽
Vol 67
(1)
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pp. 22-28
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2020 ◽
Vol 1679
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pp. 022045
2020 ◽
Vol 1695
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pp. 012153
1992 ◽
Vol 39
(6)
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pp. 1698-1703
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1990 ◽
Vol 29
(Part 2, No. 12)
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pp. L2163-L2164
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2020 ◽
Vol 1695
◽
pp. 012160
2005 ◽
Vol 49
(6)
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pp. 945-955
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