The Influence of Ion Track Characteristics on Single Event Upsets and Multiple-Cell Upsets in Nanometer SRAM
2011 ◽
Vol 58
(6)
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pp. 2591-2598
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Keyword(s):
The orientational dependence of single event upsets and multiple-cell upsets in 65 nm dual DICE SRAM
2019 ◽
Vol 94
◽
pp. 24-31
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2005 ◽
Vol 52
(6)
◽
pp. 2319-2325
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1994 ◽
Vol 41
(6)
◽
pp. 2244-2251
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