Photoelectric Characteristics of GaAs and LT-GaAs Studied by OPTP Spectroscopy

Author(s):  
Jun Zhou ◽  
Shuting Wu ◽  
Yanshun Zheng ◽  
Zhenzhen Ge ◽  
Xin Rao ◽  
...  
Author(s):  
Alain Claverie ◽  
Zuzanna Liliental-Weber

GaAs layers grown by MBE at low temperatures (in the 200°C range, LT-GaAs) have been reported to have very interesting electronic and transport properties. Previous studies have shown that, before annealing, the crystalline quality of the layers is related to the growth temperature. Lowering the temperature or increasing the layer thickness generally results in some columnar polycrystalline growth. For the best “temperature-thickness” combinations, the layers may be very As rich (up to 1.25%) resulting in an up to 0.15% increase of the lattice parameter, consistent with the excess As. Only after annealing are the technologically important semi-insulating properties of these layers observed. When annealed in As atmosphere at about 600°C a decrease of the lattice parameter to the substrate value is observed. TEM studies show formation of precipitates which are supposed to be As related since the average As concentration remains almost unchanged upon annealing.


Author(s):  
Jessica Afalla ◽  
Elizabeth Ann Prieto ◽  
Karl Cedric Gonzales ◽  
Gerald Catindig ◽  
Valynn Katrine Mag-usara ◽  
...  

1991 ◽  
Vol 241 ◽  
Author(s):  
L.-W. Yin ◽  
J. Ibbetson ◽  
M. M. Hashemi ◽  
W. Jiang ◽  
S.-Y. Hu ◽  
...  

ABSTRACTDC characteristics of a GaAs MISFET structure using low-temperature GaAs (LTGaAs) as the gate insulator were investigated. MISFETs with different gate to channel separation (d) were fabricated. The dependence of four important device parameters such as gate-drain breakdown voltage (VBR), channel current at zero gate bias (Idss), transconductance (gm), and gate-drain turn-on voltage (Von) on the gate insulator thickness were analyzed. It was observed that (a) in terms of Idss and gin, the LT-GaAs gate insulator behaves like an undoped regular GaAs layer and (b) in terms of VBR and Von, the LT-GaAs gate insulator behaves as a trap dominated layer.


2020 ◽  
Vol 122 ◽  
pp. 110688 ◽  
Author(s):  
A.M. Buryakov ◽  
M.S. Ivanov ◽  
S.A. Nomoev ◽  
D.I. Khusyainov ◽  
E.D. Mishina ◽  
...  

1995 ◽  
Vol 24 (7) ◽  
pp. 913-916 ◽  
Author(s):  
K. -M. Lipka ◽  
B. Splingart ◽  
D. Theron ◽  
J. K. Luo ◽  
G. Salmer ◽  
...  

2003 ◽  
Author(s):  
Xuemei Zheng ◽  
S. Wu ◽  
R. Adam ◽  
M. Mikulics ◽  
A. Foerster ◽  
...  
Keyword(s):  

1991 ◽  
Vol 241 ◽  
Author(s):  
Y. Hwang ◽  
D. Zhang ◽  
T. Zhang ◽  
M. Mytych ◽  
R. M. Kolbas

ABSTRACTIn this work we demonstrate that photopumped quantum wellheterostructure lasers with excellent optical quality can be grown ontop of a LT GaAs buffer layer by molecular beam epitaxy. Hightemperature thermal annealing of these lasers blue-shifts the laseremission wavelengths but the presence/absence of a LT GaAs layerhad little effect on the overall laser thresholds. Also, to first order itwas not necessary to include an AlAs barrier layer to preventadverse effects (as has been necessary in the gate stack of MESFETs to prevent carrier compensation).


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