Dielectric material measurements supported by Electromagnetic field solvers

2011 ◽  
Author(s):  
Emre Kilic ◽  
Uwe Start ◽  
Carsten H. Schmidt ◽  
Thomas F. Eibert
Keyword(s):  
Electromagnetic Field ◽  
Dielectric Material ◽  
Electromagnetic Field Solvers

Reflection Intensity Measurement for Dielectric Material Using a Microwave Single Probe and Its Electromagnetic Field Analysis

2006 ◽  
Vol 301 ◽  
pp. 125-128 ◽  
Author(s):  
Hirofumi Kakemoto ◽  
Satoshi Wada ◽  
Takaaki Tsurumi
Keyword(s):  
Electromagnetic Field ◽  
Simulation Model ◽  
Dielectric Material ◽  
Impedance Matching ◽  
Coaxial Cable ◽  
Field Analysis ◽  
Single Crystal Substrate ◽  
Single Probe ◽  
Crystal Substrate ◽  
Reflection Intensity

Microwave reflection intensity for microwave absorber, Cu-plate and Al2O3 (0001) single crystal substrate was measured from 8GHz to11GHz as a function of distance between single probe and sample at room temperature. The minimum reflection intensity was observed in the distance of 0.2mm between single probe and sample at 9.4GHz, although the reflection intensity was decreased with increasing distance in other measurement frequencies. The electromagnetic field analysis was hence carried out for simulation model that is defined with coaxial cable, probe and sample using finite differential time domain method. The reflection coefficient and impedance for simulation model were calculated, and compared to the experimental data. From results of electromagnetic analysis, the minimum point of reflection intensity was caused from an impedance matching.

scholarly journals Comparison of electromagnetic field solvers for the 3D analysis of plasmonic nanoantennas

2009 ◽  
Author(s):  
Johannes Hoffmann ◽  
Christian Hafner ◽  
Patrick Leidenberger ◽  
Jan Hesselbarth ◽  
Sven Burger
Keyword(s):  
Electromagnetic Field ◽  
3D Analysis ◽  
Plasmonic Nanoantennas ◽  
Electromagnetic Field Solvers

Successful Practices for the Modeling of Printed Circuit Boards and Substrates Using Electromagnetic Field Solvers

2010 ◽  
Vol 2010 (1) ◽  
pp. 000413-000421 ◽  
Author(s):  
Steven G. Pytel ◽  
Scott C. McMorrow ◽  
Tom Dagostino ◽  
Sergey Polstyanko ◽  
Werner Thiel ◽  
...  
Keyword(s):  
Electromagnetic Field ◽  
High Speed ◽  
Printed Circuit Boards ◽  
Boundary Element Methods ◽  
System Level ◽  
Circuit Boards ◽  
Printed Circuit ◽  
Circuit Simulator ◽  
Reference Design ◽  
Electromagnetic Field Solvers

The aim of this work is to provide strategies for creating highly accurate models of printed circuit boards (PCBs) and substrates using electromagnetic field solvers. It will examine how to choose the correct field solver for a particular application from among full-wave, modal decomposition, finite element and boundary element methods. Tradeoffs between time and accuracy of the different solvers will be discussed. The focus is on model creation for use in time domain circuit simulators, but analysis of the frequency domain data will be used to correlate measurement to simulation. The problem of correlating simulation results with measurements is also discussed. A physical layer reference design (PLRD) board has been constructed, measured and simulated with the various field solvers. The results are analyzed to understand why differences occur between simulation and measured data. The impacts of these differences on system-level simulations of high-speed serial links are studied using a circuit simulator.

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