Time-domain analog-to-digital converters with domino delay lines

Delay Lines ◽

A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters

13th Asian Test Symposium ◽

10.1109/ats.2004.18 ◽

2005 ◽

Cited By ~ 3

Author(s):

Hsin-Wen Ting ◽

Bin-Da Liu ◽

Soon-Jyh Chang

Keyword(s):

Time Domain ◽

Analog To Digital ◽

Test Methodology ◽

Self Test ◽

Built In Self Test

A high linear voltage-to-time converter (VTC) with 1.2 V input range for time-domain analog-to-digital converters

Microelectronics Journal ◽

10.1016/j.mejo.2019.04.003 ◽

2019 ◽

Vol 88 ◽

pp. 18-24 ◽

Cited By ~ 4

Author(s):

Haizhu Liu ◽

Maliang Liu ◽

Zhangming Zhu ◽

Yintang Yang

Keyword(s):

Time Domain ◽

Analog To Digital ◽

Input Range ◽

Linear Voltage

A Real-time Multiresolution Time-domain EMI Measurement System based on Ultra-fast High Resolution Analog-to-Digital Converters

2006 International Conference on Microwaves, Radar & Wireless Communications ◽

10.1109/mikon.2006.4345268 ◽

2006 ◽

Cited By ~ 3

Author(s):

Stephan Braun ◽

Stoyan Iliev ◽

Mohammed Al-Qedra ◽

Peter Russer

Keyword(s):

High Resolution ◽

Real Time ◽

Measurement System ◽

Time Domain ◽

A high-speed high-accuracy voltage-to-time-difference converter for time domain analog-to-digital converters

2015 IEEE International Symposium on Circuits and Systems (ISCAS) ◽

10.1109/iscas.2015.7169139 ◽

2015 ◽

Cited By ~ 1

Author(s):

Yu-Chuan Lin ◽

Hen-Wai Tsao

Keyword(s):

Time Domain ◽

High Speed ◽

High Accuracy ◽

Time Difference ◽

On the Signature Analysis of Analog-to-Digital Converters

i-manager’s Journal on Software Engineering ◽

10.26634/jse.4.3.1117 ◽

2010 ◽

Vol 4 (3) ◽

pp. 44-49

Author(s):

Vadim Geurkov ◽

L. Kirischian

Keyword(s):

Signature Analysis ◽

CAD/EDA, MODELING AND SIMULATION IN MODERN ELECTRONICS: COLLECTION OF SCIENTIFIC PAPERS OF THE III INTERNATIONAL SCIENTIFIC AND PRACTICAL CONFERENCE ◽

MODELING OF ANALOG-TO-DIGITAL CONVERTERS IN THE MULTISIM

10.30987/conferencearticle_5e0282150b0a94.52925909 ◽

2019 ◽

Author(s):

Aleksandr Shtin

Keyword(s):

Electronic Devices ◽

Analog To Digital ◽

Functional Units

The report examined the features of modeling in Multisim such functional units of electronic devices as analog-to-digital converters.

An ICA Framework for Digital Background Calibration of Analog-to-Digital Converters

Sampling Theory, Signal Processing, and Data Analysis ◽

10.1007/bf03549557 ◽

2012 ◽

Vol 11 (2-3) ◽

pp. 253-270

Author(s):

Yun Chiu ◽

Seung-Chul Lee ◽

Wenbo Liu

Keyword(s):

Background Calibration ◽

Analog To Digital ◽

Digital Background Calibration

Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2010575 ◽

2009 ◽

Vol 58 (4) ◽

pp. 786-790 ◽

Cited By ~ 10

Author(s):

R. Iuzzolino ◽

L. Palafox ◽

W.G. Kurten Ihlenfeld ◽

E. Mohns ◽

C. Brendel

Keyword(s):

Sampling System ◽

Sigma Delta ◽

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

Phase-plane characterization of analog-to-digital converters

10.1109/imtc.2004.1351105 ◽

2004 ◽

Cited By ~ 1

Author(s):

C.L. Monteiro ◽

P. Arpaia ◽

A.C. Serra

Keyword(s):

Phase Plane ◽

A new method for testing the effective number of bits of analog to digital converters

1996 IEEE Nuclear Science Symposium. Conference Record ◽

10.1109/nssmic.1996.591036 ◽

2002 ◽

Author(s):

J. Basilio Simoes ◽

C.F.M. Loureiro ◽

J. Landeck ◽

C.M.B.A. Correia

Keyword(s):

New Method ◽

Effective Number ◽