Fault testing for reversible circuits

Proceedings. 21st VLSI Test Symposium, 2003. ◽

10.1109/vtest.2003.1197682 ◽

2003 ◽

Author(s):

K.N. Patel ◽

J.P. Hayes ◽

I.L. Markov

Keyword(s):

Fault Testing ◽

Reversible Circuits

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On Fault Testing for Reversible Circuits

IEICE Transactions on Information and Systems ◽

10.1093/ietisy/e91-d.12.2770 ◽

2008 ◽

Vol E91-D (12) ◽

pp. 2770-2775 ◽

Author(s):

S. TAYU ◽

S. ITO ◽

S. UENO

Keyword(s):

Fault Testing ◽

Reversible Circuits

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On the Fault Testing for Reversible Circuits

Algorithms and Computation - Lecture Notes in Computer Science ◽

10.1007/978-3-540-77120-3_70 ◽

2007 ◽

pp. 812-821 ◽

Author(s):

Satoshi Tayu ◽

Shigeru Ito ◽

Shuichi Ueno

Keyword(s):

Fault Testing ◽

Reversible Circuits

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Fault Testing for Reversible Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2004.831576 ◽

2004 ◽

Vol 23 (8) ◽

pp. 1220-1230 ◽

Author(s):

K.N. Patel ◽

J.P. Hayes ◽

I.L. Markov

Keyword(s):

Fault Testing ◽

Reversible Circuits

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Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

IEICE Transactions on Electronics ◽

10.1587/transele.e99.c.1219 ◽

2016 ◽

Vol E99.C (10) ◽

pp. 1219-1225

Author(s):

Masahiro ISHIDA ◽

Toru NAKURA ◽

Takashi KUSAKA ◽

Satoshi KOMATSU ◽

Kunihiro ASADA

Keyword(s):

Power Supply ◽

Supply Voltage ◽

Voltage Control ◽

Fault Testing ◽

Power Supply Voltage ◽

Delay Fault ◽

Delay Fault Testing

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

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Fault Masking and Diagnosis in Reversible Circuits

2011 Sixteenth IEEE European Test Symposium ◽

10.1109/ets.2011.19 ◽

2011 ◽

Author(s):

Masoud Zamani ◽

Navid Farazmand ◽

Mehdi B. Tahoori

Keyword(s):

Reversible Circuits ◽

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Transition delay fault testing of 3D ICs with IR-drop study

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231065 ◽

2012 ◽

Author(s):

Shreepad Panth ◽

Sung Kyu Lim

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Ir Drop ◽

3D Ics ◽

Transition Delay

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Small-Scale Arc Fault Testing of Medium-Voltage Metal-Enclosed Switchgear

IEEE Transactions on Power Delivery ◽

10.1109/tpwrd.2015.2482002 ◽

2016 ◽

Vol 31 (1) ◽

pp. 37-43 ◽

Author(s):

Elin Fjeld ◽

Svein T. Hagen

Keyword(s):

Small Scale ◽

Fault Testing ◽

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Dynamic Fault Testing of Ground Sensing Relays

IEEE Transactions on Industry Applications ◽

10.1109/tia.1983.4504323 ◽

1983 ◽

Vol IA-19 (6) ◽

pp. 975-979 ◽

Author(s):

John B. Krick ◽

Charles D. Potts

Keyword(s):

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DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits

Journal of Circuits System and Computers ◽

10.1142/s0218126622501286 ◽

2021 ◽

Author(s):

Joyati Mondal ◽

Dipak Kumar Kole ◽

Hafizur Rahaman ◽

Debesh Kumar Das ◽

Bhargab B. Bhattacharya

Keyword(s):

Test Set ◽

Universal Test ◽

Reversible Circuits

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