Temperature-Dependent Current Collapse and Gate Leakage in AlGaN/GaN HEMTs With Si-rich SiN Interlayer
2008 ◽
Vol 128
(6)
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pp. 885-889
2002 ◽
Vol 194
(2)
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pp. 447-451
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2010 ◽
Vol 93
(6)
◽
pp. 19-24
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