Temperature-Dependent Current Collapse and Gate Leakage in AlGaN/GaN HEMTs With Si-rich SiN Interlayer

Author(s):  
Jielong Liu ◽  
Yuwei Zhou ◽  
Minhan Mi ◽  
Jiejie Zhu ◽  
Siyu Liu ◽  
...  
2002 ◽  
Vol 194 (2) ◽  
pp. 447-451 ◽  
Author(s):  
T. Mizutani ◽  
Y. Ohno ◽  
M. Akita ◽  
S. Kishimoto ◽  
K. Maezawa
Keyword(s):  

Author(s):  
Min Tang ◽  
Liang Chen ◽  
Bo Li ◽  
Haikun Yue ◽  
Yang Tang ◽  
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2020 ◽  
Vol 13 (3) ◽  
pp. 456-462
Author(s):  
Yuan Li ◽  
Yuanfu Zhao ◽  
Alex Q. Huang ◽  
Liqi Zhang ◽  
Qingyun Huang ◽  
...  

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