X-ray Photoelectron Spectroscopy Characterization of Ion-Beam Sputter-Deposited Calcium Phosphate Coatings

1991 ◽  
Vol 74 (9) ◽  
pp. 2301-2304 ◽  
Author(s):  
Joo L. Ong ◽  
Larry A. Harris ◽  
Linda C. Lucas ◽  
William R. Lacefield ◽  
Douglas Rigney
2000 ◽  
Vol 130 (1) ◽  
pp. 39-45 ◽  
Author(s):  
Changxiang Wang ◽  
Zhiqing Chen ◽  
Limin Guan ◽  
Zhongyang Liu ◽  
Peilu Wang ◽  
...  

Author(s):  
Travis Blalock ◽  
Xiao Bai ◽  
Afsaneh Rabiei

The effect of substrate temperature and processing parameters on microstructure and crystallinity of calcium phosphate coatings deposited on heated substrates in an Ion Beam Assisted Deposition (IBAD) system are being studied. The experimental procedures include mechanical testing and film thickness measurements using bonding strength and profilometery. Cross-sectional scanning transmission electron microscopy (STEM) with energy dispersive X-ray spectroscopy (EDX) through the thickness of the film as well as scanning electron microscopy (SEM) with EDX at the top surface of the film was performed to evaluate the microstructure of the film. The coating crystallinity was studied through X-ray diffraction (XRD). The information gained from current analysis on the set temperature coatings will be used to refine the processing techniques of the Functionally Graded Hydroxyapatite (FGHA) coating.


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