Accurate Determination of Optical Functions of Ge-As-Te Glasses via Spectroscopic Ellipsometry

2014 ◽  
Vol 97 (10) ◽  
pp. 3044-3047 ◽  
Author(s):  
Petra Hawlová ◽  
Frédéric Verger ◽  
Virginie Nazabal ◽  
Rémi Boidin ◽  
Petr Němec
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Accurate Determination ◽  
Optical Functions

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

Spectroscopic Ellipsometry of the Optical Functions of Some Widely Used Organic Light Emitting Diodes (OLEDs) Materials.

2005 ◽  
Vol 871 ◽  
Author(s):  
Z. T. Liu ◽  
C. C. Oey ◽  
A. B. Djuriši ◽  
C. Y. Kwong ◽  
C. H. Cheung ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Indium Tin Oxide ◽  
High Vacuum ◽  
Light Emitting ◽  
Glass Substrates ◽  
Optical Functions ◽  
Conducting Materials ◽  
Ito Glass ◽  
Polystyrene Sulfonic Acid

AbstractIn this work, optical functions of some widely used OLEDs materials 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP), tris (8-hydroxyquinoline) aluminum (Alq3), (N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine (NPB),poly(3,4,-ethylene dioxythiophene):polystyrene sulfonic acid (PEDOT:PSS) and indium tin oxide (ITO)) were studied using spectroscopic ellipsometry (SE) in the spectral range from 1.55 eV to 4.1 eV (wavelength range of 300 nm to 800 nm). The samples were prepared either by thermal evaporation in high vacuum or spin-coating of thin films onto glass substrates. For determination of the optical functions of ITO, commercial ITO glass was used. Measurements at different incident angles were performed to determine whether the samples can be considered isotropic. The SE data were modeled using an oscillator model (Lorentz for semiconducting and Lorentz-Drude for conducting materials). The absorption spectra were also measured, and the comparison with the data determined by SE is given.

Real-time spectroscopic ellipsometry for determination of the optical functions of ion-beam-deposited hydrogenated amorphous carbon

1990 ◽  
Vol 193-194 ◽  
pp. 361-370 ◽  
Author(s):  
Y. Cong ◽  
I. An ◽  
R.W. Collins ◽  
K. Vedam ◽  
H.S. Witham ◽  
...  
Keyword(s):  
Real Time ◽  
Amorphous Carbon ◽  
Spectroscopic Ellipsometry ◽  
Ion Beam ◽  
Hydrogenated Amorphous Carbon ◽  
Optical Functions ◽  
Hydrogenated Amorphous

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

2001 ◽  
Vol 16 (12) ◽  
pp. 3554-3559 ◽  
Author(s):  
J. García-Serrano ◽  
N. Koshizaki ◽  
T. Sasaki ◽  
G. Martínez-Montes ◽  
U. Pal
Keyword(s):  
Film Thickness ◽  
Quartz Glass ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Composite Films ◽  
Two Phase ◽  
Glass Substrates ◽  
Optical Functions ◽  
Substrate Film

The optical constants of Si/ZnO composite films grown on quartz glass substrates were determined in the spectral range 1.5–5.0 eV by spectroscopic ellipsometry using a rotating-analyzer ellipsometer. The structure of the samples was modeled by a two-phase (substrate–film) model, and the optical functions of the film were parameterized through different effective medium approximations. The results allowed us to estimate the microstructural film parameters, such as film thickness, the volume fractions of each of the constituents, and optical constants.

Accurate Determination of the Index of Refraction of Polymer Blend Films by Spectroscopic Ellipsometry

2010 ◽  
Vol 114 (35) ◽  
pp. 15094-15101 ◽  
Author(s):  
Annie Ng ◽  
Chi Ho Li ◽  
Man Kin Fung ◽  
Aleksandra B. Djurišić ◽  
J. A. Zapien ◽  
...  
Keyword(s):  
Polymer Blend ◽  
Spectroscopic Ellipsometry ◽  
Accurate Determination ◽  
Index Of Refraction ◽  
Blend Films

Real time spectroscopic ellipsometry determination of the evolution of amorphous semiconductor optical functions, bandgap, and microstructure

1991 ◽  
Vol 137-138 ◽  
pp. 787-790 ◽  
Author(s):  
Y.M. Li ◽  
Ilsin An ◽  
H.V. Nguyen ◽  
C.R. Wronski ◽  
R.W. Collins
Keyword(s):  
Real Time ◽  
Spectroscopic Ellipsometry ◽  
Amorphous Semiconductor ◽  
Optical Functions

Accurate determination of optical constants of textured SnO2 using low incidence angle spectroscopic ellipsometry

2004 ◽  
Vol 96 (10) ◽  
pp. 5469-5477 ◽  
Author(s):  
P. D. Paulson ◽  
Steven S. Hegedus
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Incidence Angle ◽  
Accurate Determination ◽  
Low Incidence

Determination of the optical functions of transparent glasses by using spectroscopic ellipsometry

1991 ◽  
Vol 30 (30) ◽  
pp. 4310 ◽  
Author(s):  
G. E. Jellison ◽  
B. C. Sales
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Functions
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