Exploration of the Feasibility of Using Electroosmotic Pumps in Cell Culture

Author(s):  
Tomasz Glawdel ◽  
Carolyn Ren

A new continuous perfusion cell culture chip is studied that utilizes electroosmotic pumping to control fluid flow. Electroosmotic flow is not typically used for living cells due to the inherently high electric fields that may harm cells. Problems associated with EOF and cells are solved by incorporating electroosmotic pumps (EO pumps) which generate an induced pressure driven flow in regions with cells. Several advantages of EO pumps include pulse free flow, quick flow control and precise movement of minute volumes of fluid. An ion exchange system consisting of photopolymerized salt bridges are used to separate the media from the electrode reservoirs. However, the high salt concentration in cell culture medium creates significant problems for EO pumps such as decreased flow rate due to low zeta potential, increased electrolysis due to high current draw, significant joule heating, bubble formation and polarization. Attempts to solve these problems with the proposed microfluidic chip are discussed. The pumps are characterized to determine the flow rate for applied currents. Preliminary results with rainbow trout gill cells show that pump can be operated for 5hrs without harming the cells. The work presented here discusses the design and development of the system to this point.

2005 ◽  
Author(s):  
Daejoong Kim ◽  
Jonathan D. Posner ◽  
Juan G. Santiago

We present experimental investigations of porous glass electroosmotic pumping of various low conductivity solutions. We evaluate pump pressure, flow rate, and current for sodium borate buffer, deionized water, deuterium oxide, methanol, and acetone. We present data for several figures of merit associated with steady state pumping, and present selected transient data measurements.


Author(s):  
J. J. Hren ◽  
S. D. Walck

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.


1993 ◽  
Vol 297 ◽  
Author(s):  
Qing Gu ◽  
Eric A. Schiff ◽  
Jean Baptiste Chevrier ◽  
Bernard Equer

We have measured the electron drift mobility in a-Si:H at high electric fields (E ≤ 3.6 x 105 V%cm). The a-Si:Hpin structure was prepared at Palaiseau, and incorporated a thickp+ layer to retard high field breakdown. The drift mobility was obtained from transient photocurrent measurements from 1 ns - 1 ms following a laser pulse. Mobility increases as large as a factor of 30 were observed; at 77 K the high field mobility de¬pended exponentially upon field (exp(E/Eu), where E u= 1.1 x 105 V%cm). The same field dependence was observed in the time range 10 ns – 1 μs, indicating that the dispersion parameter change with field was negligible. This latter result appears to exclude hopping in the exponential conduction bandtail as the fundamental transport mechanism in a-Si:H above 77 K; alternate models are briefly discussed.


2009 ◽  
Vol 113 (39) ◽  
pp. 17045-17058 ◽  
Author(s):  
J.-S. McEwen ◽  
P. Gaspard ◽  
T. Visart de Bocarmé ◽  
N. Kruse

2000 ◽  
Vol 33 (19) ◽  
pp. 2379-2387 ◽  
Author(s):  
Jan Kalinowski ◽  
Massimo Cocchi ◽  
Piergiulio Di Marco ◽  
Waldemar Stampor ◽  
Gabriele Giro ◽  
...  

1998 ◽  
Vol 294 (1-3) ◽  
pp. 255-261 ◽  
Author(s):  
Dawn L. Scovell ◽  
Tim D. Pinkerton ◽  
Bruce A. Finlayson ◽  
Eric M. Stuve

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