Fluorocarbon Films Deposited by Deep Reactive Ion Etching for Stiction Minimization of MEMS Structures
Keyword(s):
Fluorocarbon films, which can be used to minimize stiction of silicon microstructures, have been deposited by passivation process in deep reactive ion etching tool. The wettability, surface energy, nano-scale adhesive force, and thermal stability have been investigated by contact angle measuring system, atomic force microscopy (AFM) and ellipsometry. The fluorocarbon films are good for anti-stiction applications due to their high water contact angle (110°), low surface energy (14.5mJ/m2), low nano-scale adhesive force (33 nN) and high thermal stability up to 300°C.
2005 ◽
Vol 23
(3)
◽
pp. 434-439
◽
2007 ◽
Vol 221
(2)
◽
pp. 41-48
◽
2011 ◽
Vol 21
(10)
◽
pp. 105001
1999 ◽
Vol 8
(2)
◽
pp. 152-160
◽
Keyword(s):
2014 ◽
Vol 113
◽
pp. 35-39
◽
Keyword(s):
2018 ◽
Vol 283
◽
pp. 65-78
◽
2002 ◽
Vol 11
(3)
◽
pp. 264-275
◽
2006 ◽
Vol 16
(12)
◽
pp. 2570-2575
◽
Keyword(s):