scholarly journals Ultrahigh vacuum deposition of higher manganese silicide Mn4Si7 thin films

Author(s):  
Rajendra P. Dulal ◽  
Bishnu R. Dahal ◽  
Ian L. Pegg ◽  
John Philip
2002 ◽  
Vol 81 (4) ◽  
pp. 649-651 ◽  
Author(s):  
M. Rebien ◽  
W. Henrion ◽  
H. Angermann ◽  
S. Teichert

2018 ◽  
Vol 458 ◽  
pp. 700-704
Author(s):  
Kei Hayashi ◽  
Kentaro Ishii ◽  
Chihiro Kawasaki ◽  
Ryosuke Honda ◽  
Yuzuru Miyazaki

1957 ◽  
Vol 104 (5) ◽  
pp. 116C ◽  
Author(s):  
L. Holland ◽  
Joseph Greenspan
Keyword(s):  

1961 ◽  
Vol 12 (5) ◽  
pp. 255-256 ◽  
Author(s):  
G N Srivastava ◽  
G D Scott
Keyword(s):  

1993 ◽  
Vol 311 ◽  
Author(s):  
W.W. Hsieh ◽  
J.J. Lin ◽  
M.M. Wang ◽  
L.L. Chen

ABSTRACTSimultaneous occurrence of multiphases was observed in the interfacial reactions of ultrahigh vacuum deposited Ti, Hf and Cr thin films on (111)Si by high resolution transmission electron microscopy in conjunction with fast Fourier transform diffraction analysis and image simulation. For the three systems, an amorphous interlayer as well as a number of crystalline phase were found to form simultaneously in the early stages of interfacial reactions. The formation of multiphases appeared to be quite general in the initial stages of interfacial reactions of UHV deposited refractory thin films. The results called for a reexamination of generally accepted “difference” in reaction sequence between bulk and thin film couples.


2019 ◽  
Vol 19 (3) ◽  
pp. 1699-1703 ◽  
Author(s):  
Si-Young Son ◽  
Yeon-Jin Baek ◽  
Ji-Hyun Beck ◽  
Jong-Bae Kim ◽  
Seung-Ho Yang ◽  
...  

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