metallic film
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Symmetry ◽  
2021 ◽  
Vol 13 (9) ◽  
pp. 1569
Author(s):  
M. N. Chernodub

It is difficult to imagine an isolated classical object which possess different moments of inertia when it is uniformly rotated about the same axis with the same angular frequency in opposite, clockwise and counterclockwise, directions. We argue that due to quantum effects, certain (semi-) conductors should exhibit asymmetry in their mechanical and conducting properties with respect to the opposite rotations. We show that a cylinder made of a suitably chosen semiconductor, coated in a metallic film and placed in the magnetic-field background, can serve as a “rotational diode”, which conducts electricity only at a specific range of angular frequencies. The critical angular frequency and the direction of rotation can be tuned with the magnetic field’s strength. Mechanically, the rotational diode possesses different moments of inertia when rotated in clockwise and counterclockwise directions. These effects emerge as a particularity of the Fermi-Dirac statistics of electrons in rotating conductors.


2021 ◽  
Vol 5 (1) ◽  
pp. 7
Author(s):  
Agnieszka Królicka ◽  
Jerzy Zarębski ◽  
Andrzej Bobrowski

In the present work, it has been shown that bismuth film electrodes deposited on screen-printed carbon supports could be successfully used to provide well-shaped, sensitive and reproducible catalytic adsorptive stripping signals of Ge(IV) in the presence of catechol and V(IV)-HEDTA (HEDTA-N-hydroxyethyl-ethylene diamine-triacetic acid) complex.


2021 ◽  
Author(s):  
Almaz Gazizov ◽  
Anton Kharitonov ◽  
Myakzyum Salakhov ◽  
Sergey Kharintsev

Author(s):  
Uanderson Mezavila-Garcia ◽  
Janaina S. Santos ◽  
Elidiane C. Rangel ◽  
Nilson C. Cruz ◽  
Francisco Trivinho-Strixino

In this work, the assembly of a low-cost metallizer is presented, based on physical vapor deposition, to obtain metallic aluminum film deposited over a glass substrate. Later, the Al film is anodized and converted into a porous nanostructured oxide film. The metallic film thickness was measured by profilometry, and the sample position inside the chamber was evaluated. Samples positioned at the center of the sample holder showed considerable thickness and best homogeneity compared to those samples positioned at the edges of the sample holder. A thick metallic film of Al (6 to 7 µm) was deposited over the glass substrate for subsequent anodizing treatment. Mild anodization allowed the total conversion of metallic Al after 7000 s, producing a transparent anodic aluminum oxide (AAO) film adhered to the glass substrate. The AAO morphology was investigated by SEM. Some factors have been listed to describe the low regularity and homogeneity of nanopores in the outer layer of AAO, such as internal defects, compaction of deposited Al film layers and the glass substrate roughness.


2021 ◽  
Vol 118 (18) ◽  
pp. 184105
Author(s):  
I. C. Bandac ◽  
A. S. Barabash ◽  
L. Bergé ◽  
Ch. Bourgeois ◽  
J. M. Calvo-Mozota ◽  
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2021 ◽  
Vol 119 ◽  
pp. 102420
Author(s):  
Mingyang Lu ◽  
Xiaobai Meng ◽  
Ruochen Huang ◽  
Liming Chen ◽  
Anthony Peyton ◽  
...  

Nanophotonics ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Tom A. W. Wolterink ◽  
Robin D. Buijs ◽  
Giampiero Gerini ◽  
A. Femius Koenderink ◽  
Ewold Verhagen

Abstract We study how nanophotonic structures can be used for determining the position of a nearby nanoscale object with subwavelength accuracy. Through perturbing the near-field environment of a metasurface transducer consisting of nano-apertures in a metallic film, the location of the nanoscale object is transduced into the transducer’s far-field optical response. By monitoring the scattering pattern of the nanophotonic near-field transducer and comparing it to measured reference data, we demonstrate the two-dimensional localization of the object accurate to 24 nm across an area of 2 × 2 μm. We find that adding complexity to the nanophotonic transducer allows localization over a larger area while maintaining resolution, as it enables encoding more information on the position of the object in the transducer’s far-field response.


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