Determination and application of the depth resolution function in sputter profiling with secondary ion mass spectroscopy and Auger electron spectroscopy
1998 ◽
Vol 16
(3)
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pp. 1096-1102
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2009 ◽
pp. 86-86-15
1991 ◽
Vol 5
(11)
◽
pp. 987-999
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1999 ◽
Vol 17
(3)
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pp. 939-944
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1995 ◽
Vol 231
(1-2)
◽
pp. 354-363
◽
1992 ◽
Vol 3
(4)
◽
pp. 257-262
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2001 ◽
Vol 19
(4)
◽
pp. 1111-1115
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