Development of a triplasmatron ion source for the generation of SF5+ and F− primary ion beams on an ion microscope secondary ion mass spectrometry instrument
1999 ◽
Vol 17
(3)
◽
pp. 845-852
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New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications
2007 ◽
Vol 78
(8)
◽
pp. 085101
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Keyword(s):
2001 ◽
Vol 19
(2)
◽
pp. 568-575
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Keyword(s):
2003 ◽
Vol 203-204
◽
pp. 209-213
◽
Keyword(s):
1983 ◽
Vol 218
(1-3)
◽
pp. 303-306
◽
Keyword(s):
1994 ◽
Vol 65
(7)
◽
pp. 2276-2280
◽
Keyword(s):
Keyword(s):
1989 ◽
Vol 111
(15)
◽
pp. 5577-5583
◽
Keyword(s):