Reconstructed two-dimensional doping profiles from multiple one-dimensional secondary ion mass spectrometry measurements

1992 ◽  
Vol 10 (1) ◽  
pp. 369 ◽  
Author(s):  
Scott H. Goodwin-Johansson
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Two Dimensional ◽  
One Dimensional ◽  
Ion Mass Spectrometry ◽  
Doping Profiles ◽  
Secondary Ion

scholarly journals Dating of Obsidian Tools by Water Diffusion (SIMS-SS) with a Novel Software

2020 ◽  
Vol 13 ◽  
pp. 234
Author(s):  
I. Liritzis ◽  
T. Ganetsos ◽  
N. Laskaris
Keyword(s):  
Mass Spectrometry ◽  
Diffusion Process ◽  
Depth Profile ◽  
Secondary Ion Mass Spectrometry ◽  
Environmental Water ◽  
Water Diffusion ◽  
Asia Minor ◽  
One Dimensional ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Diffusion of environmental water into the surface of obsidian tools of archaeological origin is monitored by secondary ion mass spectrometry (SIMS), which provides a H+ concentration (C) versus hydration depth profile. The modeling of this diffusion process, as one-dimensional phenomena, is based on the idea that a saturated surface (SS) layer is encountered near the surface. A novel software program has been developed, using MATLAB, incorporating all numerical parameters for the dating of hydrated obsidians using the SIMS profile. This approach has been applied to several archaeological obsidians from the Aegean, Hungary, and Asia Minor and compared with samples from radiocarbon dated cultural phases where the agreement is excellent.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Sign in / Sign up

Export Citation Format

Share Document