Combined atomic force microscopy-Raman mapping of electric field enhancement and surface-enhanced Raman scattering hot-spots for nanosphere lithography substrates

2011 ◽  
Vol 5 (1) ◽  
pp. 059504 ◽  
Author(s):  
Claire S. Sweetenham
Keyword(s):  
Atomic Force Microscopy ◽  
Hot Spots ◽  
Field Enhancement ◽  
Raman Mapping ◽  
Electric Field Enhancement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Enhanced ◽  
Surface Enhanced Raman ◽  
Enhanced Raman Scattering

Surface-Enhanced Raman Scattering and Atomic Force Microscopy of Brass Electrodes in Sulfuric Acid Solution Containing Benzotriazole and Chloride Ion

1993 ◽  
Vol 47 (1) ◽  
pp. 80-84 ◽  
Author(s):  
Joel C. Rubim ◽  
Jae-Ho Kim ◽  
Eric Henderson ◽  
Therese M. Cotton
Keyword(s):  
Atomic Force Microscopy ◽  
Sulfuric Acid ◽  
Raman Scattering ◽  
Acid Solution ◽  
Chloride Ion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Enhanced ◽  
Surface Enhanced Raman ◽  
Enhanced Raman Scattering

Three different methods were used to roughen brass (Cu/Zn = 67/33) electrodes in 0.5 M H2SO4 containing 1.0 mM benzotriazole (BTAH): (1) polarization at +0.05 V vs. saturated calomel for 5 min; (2) immersion in the above solution for six hours; and (3) oxidation-reduction cycling in the presence of chloride ion. The surfaces prepared by the first two methods exhibited surface-enhanced Raman scattering (SERS) spectra of the polymeric complex [Cu(I)BTA] n. The SERS spectrum obtained from electrodes prepared by the third method is very similar to that of [CU(I)C1BTAH]4. Examination of the electrodes by atomic force microscopy (AFM) showed that a large number of grain boundary sites are formed by the roughening processes. This effect is attributed to the loss of zinc, which occurs during corrosion of the mirror-like, polished brass electrode surface in the sulfuric acid solution.

scholarly journals Study on surface enhanced Raman scattering of Au and Au@Al2O3 spherical dimers based on 3D finite element method

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Bao-xin Yan ◽  
Yan-ying Zhu ◽  
Yong Wei ◽  
Huan Pei
Keyword(s):  
Finite Element Method ◽  
Finite Element ◽  
Electric Field ◽  
Raman Scattering ◽  
Enhancement Factor ◽  
Field Enhancement ◽  
Electric Field Enhancement ◽  
Surface Enhanced ◽  
Surface Enhanced Raman ◽  
Enhanced Raman Scattering

AbstractIn this paper, the surface enhanced Raman scattering (SERS) characteristics of Au and Au@Al2O3 nanoparticle dimers were calculated and analyzed by using finite element method (3D-FEM). Firstly, the electric field enhancement factors of Au nanoparticles at the dimer gap were optimized from three aspects: the incident angle of the incident light, the radius of nanoparticle and the distance of the dimer. Then, aluminum oxide is wrapped on the Au dimer. What is different from the previous simulation is that Al2O3 shell and Au core are regarded as a whole and the total radius of Au@Al2O3 dimer is controlled to remain unchanged. By comparing the distance of Au nucleus between Au and Au@Al2O3 dimer, it is found that the electric field enhancement factor of Au@Al2O3 dimer is much greater than that of Au dimer with the increase of Al2O3 thickness. The peak of electric field of Au@Al2O3 dimer moves towards the middle of the resonance peak of the two materials, and it is more concentrated than that of the Au dimer. The maximum electric field enhancement factor 583 is reached at the shell thickness of 1 nm. Our results provide a theoretical reference for the design of SERS substrate and the extension of the research scope.

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