Improving scale invariant feature transform with local color contrastive descriptor for image classification

2017 ◽  
Vol 26 (1) ◽  
pp. 013015 ◽  
Author(s):  
Sheng Guo ◽  
Weilin Huang ◽  
Yu Qiao
2020 ◽  
Vol 2020 ◽  
pp. 1-9
Author(s):  
Mengxi Xu ◽  
Yingshu Lu ◽  
Xiaobin Wu

Conventional image classification models commonly adopt a single feature vector to represent informative contents. However, a single image feature system can hardly extract the entirety of the information contained in images, and traditional encoding methods have a large loss of feature information. Aiming to solve this problem, this paper proposes a feature fusion-based image classification model. This model combines the principal component analysis (PCA) algorithm, processed scale invariant feature transform (P-SIFT) and color naming (CN) features to generate mutually independent image representation factors. At the encoding stage of the scale-invariant feature transform (SIFT) feature, the bag-of-visual-word model (BOVW) is used for feature reconstruction. Simultaneously, in order to introduce the spatial information to our extracted features, the rotation invariant spatial pyramid mapping method is introduced for the P-SIFT and CN feature division and representation. At the stage of feature fusion, we adopt a support vector machine with two kernels (SVM-2K) algorithm, which divides the training process into two stages and finally learns the knowledge from the corresponding kernel matrix for the classification performance improvement. The experiments show that the proposed method can effectively improve the accuracy of image description and the precision of image classification.


2018 ◽  
Vol 7 (2.8) ◽  
pp. 353
Author(s):  
A Roshna Meeran ◽  
V Nithya

The paper focuses on the investigation of image processing of Electronic waste detection and identification in recycling process of all Electronic items. Some of actually collected images of E-wastes would be combined with other wastes. For object matching with scale in-variance the SIFT (Scale -Invariant- Feature Transform) is applied. This method detects the electronic waste found among other wastes and also estimates the amount of electronic waste detected the give set of wastes. The detection of electronics waste by this method is most efficient ways to detect automatically without any manual means.


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