New parametric point spread function calibration methodology for improving the accuracy of patterning prediction in electron-beam lithography

2012 ◽  
Vol 11 (1) ◽  
pp. 013009 ◽  
Author(s):  
Chun-Hung Liu
Nano Letters ◽  
2014 ◽  
Vol 14 (8) ◽  
pp. 4406-4412 ◽  
Author(s):  
Vitor R. Manfrinato ◽  
Jianguo Wen ◽  
Lihua Zhang ◽  
Yujia Yang ◽  
Richard G. Hobbs ◽  
...  

2015 ◽  
Vol 21 (S3) ◽  
pp. 699-700 ◽  
Author(s):  
Yudhishthir P. Kandel ◽  
Matthew D. Zotta ◽  
Andrew N. Caferra ◽  
Richard Moore ◽  
Eric Lifshin

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