Multilayer structures for high-performance hard x-ray optics

Author(s):  
Eleonora M. Witteles ◽  
R. D. Nelson ◽  
H. Dasarathy ◽  
Brian D. Ramsey ◽  
Jeffery J. Kolodziejczak
1996 ◽  
Author(s):  
Eleonora M. Witteles ◽  
R. D. Nelson ◽  
H. Dasarathy ◽  
Brian D. Ramsey

2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin

2015 ◽  
Vol 58 (11) ◽  
pp. 1095-1105 ◽  
Author(s):  
A S Pirozhkov ◽  
E N Ragozin

1993 ◽  
Author(s):  
Peter J. Biltoft ◽  
Steven Falabella ◽  
Ralph F. Pombo ◽  
Edward H. Noble

2010 ◽  
Vol 2010 ◽  
pp. 1-15 ◽  
Author(s):  
Marcos Bavdaz ◽  
Max Collon ◽  
Marco Beijersbergen ◽  
Kotska Wallace ◽  
Eric Wille

Silicon Pore Optics (SPO) is a new X-ray optics technology under development in Europe, forming the ESA baseline technology for the International X-ray Observatory candidate mission studied jointly by ESA, NASA, and JAXA. With its matrix-like structure, made of monocrystalline-bonded Silicon mirrors, it can achieve the required angular resolution and low mass density required for future large X-ray observatories. Glass-based Micro Pore Optics (MPO) achieve modest angular resolution compared to SPO, but are even lighter and have achieved sufficient maturity level to be accepted as the X-ray optic technology for instruments on board the Bepi-Colombo mission, due to visit the planet Mercury. Opportunities for technology transfer to ground-based applications include material science, security and scanning equipment, and medical diagnostics. Pore X-ray optics combine high performance with modularity and economic industrial production processes, ensuring cost effective implementation.


2011 ◽  
Vol 681 ◽  
pp. 19-24
Author(s):  
Bob B. He

Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.


Author(s):  
Frank Siewert ◽  
Heiner Lammert ◽  
Thomas Zeschke ◽  
Thomas Hänsel ◽  
Andreas Nickel ◽  
...  

1989 ◽  
Vol 65 (10) ◽  
pp. 3907-3913 ◽  
Author(s):  
P. Ruterana ◽  
J.‐P. Chevalier ◽  
P. Houdy
Keyword(s):  

2005 ◽  
Author(s):  
Frank Siewert ◽  
Heiner Lammert ◽  
Tino Noll ◽  
Thomas Schlegel ◽  
Thomas Zeschke ◽  
...  

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