Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

Mapping Intimacies ◽

10.1117/12.503412 ◽

2004 ◽

Cited By ~ 1

Author(s):

Donnacha P. Lowney ◽

Philip A. Heimann ◽

Eric M. Gullikson ◽

Andrew G. MacPhee ◽

Roger W. Falcone ◽

...

Keyword(s):

Quantum Efficiency ◽

Streak Camera ◽

Grazing Incidence ◽

X Ray

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Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

Review of Scientific Instruments ◽

10.1063/1.1790558 ◽

2004 ◽

Vol 75 (10) ◽

pp. 3131-3137 ◽

Cited By ~ 16

Author(s):

D. P. Lowney ◽

P. A. Heimann ◽

H. A. Padmore ◽

E. M. Gullikson ◽

A. G. MacPhee ◽

...

Keyword(s):

Quantum Efficiency ◽

Streak Camera ◽

Grazing Incidence ◽

X Ray

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Characterization of epitaxial films by grazing-incidence X-ray diffraction

Thin Solid Films ◽

10.1016/0040-6090(87)90349-x ◽

1987 ◽

Vol 154 (1-2) ◽

pp. 33-42 ◽

Cited By ~ 42

Author(s):

Armin Segmüller

Keyword(s):

Grazing Incidence ◽

Epitaxial Films ◽

X Ray Diffraction ◽

X Ray

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Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

physica status solidi (a) ◽

10.1002/pssa.201400204 ◽

2015 ◽

Vol 212 (3) ◽

pp. 523-528 ◽

Cited By ~ 12

Author(s):

Philipp Hönicke ◽

Blanka Detlefs ◽

Matthias Müller ◽

Erik Darlatt ◽

Emmanuel Nolot ◽

...

Keyword(s):

Fluorescence Analysis ◽

Grazing Incidence ◽

X Ray ◽

Gradient Systems

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First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

Spectrochimica Acta Part B Atomic Spectroscopy ◽

10.1016/j.sab.2008.10.012 ◽

2008 ◽

Vol 63 (12) ◽

pp. 1503-1510 ◽

Cited By ~ 15

Author(s):

G. Cibin ◽

A. Marcelli ◽

V. Maggi ◽

M. Sala ◽

F. Marino ◽

...

Keyword(s):

Absorption Spectroscopy ◽

Ice Cores ◽

Grazing Incidence ◽

Total Reflection ◽

X Ray ◽

Aeolian Dust ◽

X Ray Absorption

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Grazing Incidence X-Ray Characterization of Materials

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-2972-9_21 ◽

1993 ◽

pp. 171-184 ◽

Cited By ~ 17

Author(s):

D. K. Bowen ◽

M. Wormington

Keyword(s):

Grazing Incidence ◽

X Ray ◽

Characterization Of Materials

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The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays

Journal of Analytical Atomic Spectrometry ◽

10.1039/b811178b ◽

2009 ◽

Vol 24 (6) ◽

pp. 792 ◽

Cited By ~ 35

Author(s):

Alex von Bohlen ◽

Markus Krämer ◽

Christian Sternemann ◽

Michael Paulus

Keyword(s):

Coherence Length ◽

Grazing Incidence ◽

X Rays ◽

X Ray

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Characterization of Oxide Film Grown on Stainless Steel by a New In-House Grazing Incidence X-ray Scattering (GIXS) Apparatus

Materials Transactions JIM ◽

10.2320/matertrans1989.36.1 ◽

1995 ◽

Vol 36 (1) ◽

pp. 1-5 ◽

Cited By ~ 18

Author(s):

Masatoshi Saito ◽

Tomomi Kosaka ◽

Eiichiro Matsubara ◽

Yoshio Waseda

Keyword(s):

Stainless Steel ◽

Oxide Film ◽

Grazing Incidence ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction

Solid State Communications ◽

10.1016/0038-1098(91)90444-z ◽

1991 ◽

Vol 79 (11) ◽

pp. 923-928 ◽

Cited By ~ 45

Author(s):

A. Bensaid ◽

G. Patrat ◽

M. Brunel ◽

F. de Bergevin ◽

R. Hérino

Keyword(s):

Porous Silicon ◽

Grazing Incidence ◽

X Ray

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Surface and interface characterization of Ru/C/Ru trilayer structure using grazing incidence X‐ray reflectivity and X‐ray fluorescence

Surface and Interface Analysis ◽

10.1002/sia.7016 ◽

2021 ◽

Author(s):

Kiranjot ◽

Rajnish Dhawan ◽

Mohammed Hussein Modi

Keyword(s):

Grazing Incidence ◽

X Ray ◽

Interface Characterization ◽

Surface And Interface ◽

Trilayer Structure

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Atomic-Structure Characterization of Passive Film of Fe by Grazing Incidence X-ray Scattering at SPring-8

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers ◽

10.1016/b978-044452224-5/50016-0 ◽

2006 ◽

pp. 95-100 ◽

Cited By ~ 7

Author(s):

Masugu Sato ◽

Masao Kimura ◽

Masato Yamashita ◽

Hiroyuki Konishi ◽

Shinji Fujimoto ◽

...

Keyword(s):

Passive Film ◽

Atomic Structure ◽

Grazing Incidence ◽

Structure Characterization ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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