Surface and interface characterization of Ru/C/Ru trilayer structure using grazing incidence X‐ray reflectivity and X‐ray fluorescence

2021 ◽  
Author(s):  
Kiranjot ◽  
Rajnish Dhawan ◽  
Mohammed Hussein Modi
Keyword(s):  
Grazing Incidence ◽  
X Ray ◽  
Interface Characterization ◽  
Surface And Interface ◽  
Trilayer Structure

The Characterization of Thin Films and Layered Structures Using X-RAY Absorption and Reflection at Grazing Incidence

1984 ◽  
Vol 37 ◽  
Author(s):  
S. M. Heald ◽  
J. M. Tranquada ◽  
D. O. Welch ◽  
H. Chen
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
High Resolution ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray ◽  
Surface And Interface ◽  
Interface Structures ◽  
X Ray Absorption

AbstractX-rays at grazing incidence have a short, controllable penetration depth and are well suited as a probe of surface and interface structures. This paper examines the possibility applying grazing-incidence reflectivity and Extended X-Ray Absorption Fine Structure (EXAFS) measurements to such systems. Results are presented for an Al-Cu couple for which both high resolution reflectivity and interface EXAFS measurements are made. The latter results are the first interface specific EXAFS data to be reported. Distinct changes in both signals are observed upon annealing, demonstrating the potential of the techniques.

Interface characterization of B4C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering

2013 ◽  
Vol 20 (3) ◽  
pp. 449-454 ◽  
Author(s):  
Hui Jiang ◽  
Zhanshan Wang ◽  
Jingtao Zhu
Keyword(s):  
Diffuse Scattering ◽  
Aging Process ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray ◽  
Interface Characterization ◽  
Quantitative Results ◽  
Fabrication And Characterization ◽  
Stable Structures

B4C-based multilayers have important applications for soft to hard X-rays. In this paper, X-ray grazing-incidence reflectivity and diffuse scattering, combining various analysis methods, were used to characterize the structure of B4C-based multilayers including layer thickness, density, interfacial roughness, interdiffusion, correlation length,etc.Quantitative results for W/B4C, Mo/B4C and La/B4C multilayers were compared. W/B4C multilayers show the sharpest interfaces and most stable structures. The roughness replications of La/B4C and Mo/B4C multilayers are not strong, and oxidations and structure expansions are found in the aging process. This work provides guidance for future fabrication and characterization of B4C-based multilayers.

Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

2015 ◽  
Vol 212 (3) ◽  
pp. 523-528 ◽  
Author(s):  
Philipp Hönicke ◽  
Blanka Detlefs ◽  
Matthias Müller ◽  
Erik Darlatt ◽  
Emmanuel Nolot ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
X Ray ◽  
Gradient Systems

Surface and Interface Characterization of Asphaltenic Fractions Obtained with Different Alkanes: A Study by Atomic Force Microscopy and Pendant Drop Tensiometry

2018 ◽  
Vol 32 (12) ◽  
pp. 12174-12186 ◽  
Author(s):  
Iago Oliveira ◽  
Larissa Gomes ◽  
Elton Franceschi ◽  
Gustavo Borges ◽  
Juliana F. de Conto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Pendant Drop ◽  
Force Microscopy ◽  
Interface Characterization ◽  
Surface And Interface ◽  
Atomic Force
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