scholarly journals Soft crystal martensites: An in situ resonant soft x-ray scattering study of a liquid crystal martensitic transformation

2020 ◽  
Vol 6 (13) ◽  
pp. eaay5986 ◽  
Author(s):  
Hyeong Min Jin ◽  
Xiao Li ◽  
James A. Dolan ◽  
R. Joseph Kline ◽  
José A. Martínez-González ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Phase Transformations ◽  
Self Assembly ◽  
Three Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Martensitic Phase Transformations ◽  
Soft Crystal ◽  
Ray Scattering

Liquid crystal blue phases (BPs) are three-dimensional soft crystals with unit cell sizes orders of magnitude larger than those of classic, atomic crystals. The directed self-assembly of BPs on chemically patterned surfaces uniquely enables detailed in situ resonant soft x-ray scattering measurements of martensitic phase transformations in these systems. The formation of twin lamellae is explicitly identified during the BPII-to-BPI transformation, further corroborating the martensitic nature of this transformation and broadening the analogy between soft and atomic crystal diffusionless phase transformations to include their strain-release mechanisms.

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

scholarly journals Monitoring Nanocrystal Self‐Assembly in Real Time Using In Situ Small‐Angle X‐Ray Scattering

Small ◽  
2019 ◽  
Vol 15 (20) ◽  
pp. 1900438 ◽  
Author(s):  
Irina Lokteva ◽  
Michael Koof ◽  
Michael Walther ◽  
Gerhard Grübel ◽  
Felix Lehmkühler
Keyword(s):  
Real Time ◽  
Small Angle ◽  
Self Assembly ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In-Situ Synchrotron X-ray Scattering Studies of the Thermally-Induced Self-Assembly of High-Performance Aromatic Copolyesters

2014 ◽  
Vol 6 (11) ◽  
pp. 2352-2357
Author(s):  
Young Yong Kim ◽  
Kyuyoung Heo ◽  
Kyeong Sik Jin ◽  
Jehan Kim ◽  
Jong Ryang Kim ◽  
...  
Keyword(s):  
Self Assembly ◽  
High Performance ◽  
Thermally Induced ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Probing Self-Assembly of Cylindrical Morphology Block Copolymer Using in Situ and ex Situ Grazing Incidence Small-Angle X-ray Scattering: The Attractive Case of Graphoepitaxy

2014 ◽  
Vol 47 (20) ◽  
pp. 7221-7229 ◽  
Author(s):  
Mireille Maret ◽  
Raluca Tiron ◽  
Xavier Chevalier ◽  
Patrice Gergaud ◽  
Ahmed Gharbi ◽  
...  
Keyword(s):  
Block Copolymer ◽  
Small Angle ◽  
Self Assembly ◽  
Grazing Incidence ◽  
Ex Situ ◽  
X Ray ◽  
X Ray Scattering ◽  
Attractive Case ◽  
Ray Scattering

Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films

2013 ◽  
Vol 541 ◽  
pp. 21-27 ◽  
Author(s):  
Magali Putero ◽  
Benjamin Duployer ◽  
Ivan Blum ◽  
Toufik Ouled-Khachroum ◽  
Marie-Vanessa Coulet ◽  
...  
Keyword(s):  
Phase Transformations ◽  
Electrical Measurements ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals In situ small-angle X-ray scattering environment for studying nanocrystal self-assembly upon controlled solvent evaporation

2019 ◽  
Vol 90 (3) ◽  
pp. 036103 ◽  
Author(s):  
I. Lokteva ◽  
M. Walther ◽  
M. Koof ◽  
G. Grübel ◽  
F. Lehmkühler
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Solvent Evaporation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals In situ small-angle X-ray scattering studies of sterically-stabilized diblock copolymer nanoparticles formed during polymerization-induced self-assembly in non-polar media

2016 ◽  
Vol 7 (8) ◽  
pp. 5078-5090 ◽  
Author(s):  
Matthew J. Derry ◽  
Lee A. Fielding ◽  
Nicholas J. Warren ◽  
Charlotte J. Mable ◽  
Andrew J. Smith ◽  
...  
Keyword(s):  
Diblock Copolymer ◽  
Small Angle ◽  
Self Assembly ◽  
Mineral Oil ◽  
X Ray ◽  
X Ray Scattering ◽  
Polar Media ◽  
Ray Scattering

In situ SAXS studies reveal the evolution of copolymer morphology during the PISA synthesis of diblock copolymer nano-objects in mineral oil.

In-Situ X-ray Scattering Study of Continuous Silica−Surfactant Self-Assembly during Steady-State Dip Coating

2003 ◽  
Vol 107 (31) ◽  
pp. 7683-7688 ◽  
Author(s):  
Dhaval A. Doshi ◽  
Alain Gibaud ◽  
Nanguo Liu ◽  
Dietmar Sturmayr ◽  
Anthony P. Malanoski ◽  
...  
Keyword(s):  
Steady State ◽  
Self Assembly ◽  
Dip Coating ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

scholarly journals Microfluidics with In-Situ Small-Angle X-Ray Scattering: A Tool to Investigate the Neurofilament Self-Assembly Mechanism

2013 ◽  
Vol 104 (2) ◽  
pp. 141a
Author(s):  
Bruno F.B. Silva ◽  
Miguel Z. Rosales ◽  
Joanna Deek ◽  
Ulf Olsson ◽  
Youli Li ◽  
...  
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
X Ray ◽  
X Ray Scattering ◽  
Assembly Mechanism ◽  
Ray Scattering

Thermal stability of RuO2, BaxSr1−xTiO3/RuO2, and BaxSr1−xTiO3/Pt/Ti/SiO2on Si(100)

2000 ◽  
Vol 15 (9) ◽  
pp. 1955-1961 ◽  
Author(s):  
T. S. Kang ◽  
Y. S. Kim ◽  
Jung Ho Je
Keyword(s):  
Thermal Stability ◽  
Three Dimensional ◽  
Interface Roughness ◽  
Ex Situ ◽  
X Ray ◽  
Good Thermal Stability ◽  
X Ray Scattering ◽  
Thermal Stability Of ◽  
Ray Scattering

The thermal stability of RuO2/Si(100) films in air was studied using ex situ synchrotron x-ray scattering. The (110) textured RuO2 film showed good thermal stability due to the low surface and strain energies. However, the RuO2 films of high strain and surface energies were transformed to three-dimensional islands during annealing up to 800 °C. We also studied, during the post annealing process, the interface roughness of BaxSr1−xTiO3 (BST)/RuO2/Si(100) and BST/Pt/Ti/SiO2/Si(100) structures comparatively, using in situ synchrotron x-ray scattering. The interfaces of the BST/RuO2/Si were thermally stable up to 500 °C, and the deterioration of the interfaces above 500 °C was attributed to the crystallization of amorphous BST film. Meanwhile, the interfaces of the BST/Pt/Ti/SiO2/Si were significantly degraded even at the low temperature of 350 °C, mainly due to the formation of the Pt–Ti alloy and the Ti oxidation.

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